CBS Laboratories

About: CBS Laboratories is a based out in . It is known for research contribution in the topics: Stereophonic sound & NTSC. The organization has 127 authors who have published 118 publications receiving 2089 citations. The organization is also known as: CBS Labs & CBS Technology Center.

Associative holographic memories

Abstract: Recently Longuet-Higgins modeled a temporal analogue of the property of holograms that allows a complete image to be constructed from only a portion of the hologram. In the present paper a more general analogue is discussed and two two-step transformations that imitate the recording-reconstruction sequence in holography are presented. The first transformation models the recall of an entire sequence from a fragment while the second is more like human memory in that it provides recall of only the part of the sequence that follows the keying fragment. Both models require only the three operations: shift, multiplication and addition.

Laser speckle and its elimination

Abstract: "Objective" speckle arises from the uneven illumination of an object with a multiplicity of waves that interfere at its surface. "Subjective" speckle arises at rough objects even if they are illumi...

Active low-pass filter design

Abstract: The characteristics of Bessel, Butterworth, and Chebyshev filters are briefly reviewed. The "Rauch" RC active low-pass filter configuration is described and design formulae are obtained. Tables of normalized capacitor values are provided for Bessel, Butterworth, and ±½ dB, ±1 dB, ±2 dB, and ±3 dB Chebyshev filters. Two examples indicate the use of the tables.

Evaluation of Passivated Integrated Circuits Using the Scanning Electron Microscope

Abstract: By examining passivated silicon integrated circuits in the scanning electron microscope, the surface contours of p‐n junctions have been mapped, potential drops across integrated resistors have been observed, and physical characteristics of the oxide surface, evaporated leads, and bonded gold wires have been determined. Typical faults discovered by this method of testing include poor registration, improperly masked diffusions, harmful and nonharmful surface scratches, poor evaporated interconnections, and defective passivation oxide layers. Most junctions in a 40 mil square integrated circuit can be delineated with 1μ resolution in approximately 1 min by this technique.