Showing papers by "Teradyne published in 1977"
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17 Mar 1977TL;DR: An electrical tester for circuit boards in which test pins are mounted in a support derived from a corresponding unloaded circuit board and in which wires to the test pin run slidably in interfitting pairs of plastic sleeves is described in this article.
Abstract: An electrical tester for circuit boards in which test pins are mounted in a support derived from a corresponding unloaded circuit board and in which wires to the test pin run slidably in interfitting pairs of plastic sleeves.
17 citations
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25 Feb 1977TL;DR: In this article, a tester for backplanes, printed wiring boards and like electrical assemblies has contacts that mate without interference with contacts of the assembly under test, and has a displacement mechanism that shifts the assembly laterally.
Abstract: A tester for backplanes, printed wiring boards and like electrical assemblies has contacts that mate without interference with contacts of the assembly under test, and has a displacement mechanism that shifts the assembly laterally. The lateral displacement brings the mated contacts into interfering engagement with each other for effecting electrical connection between them.
13 citations
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04 Apr 1977TL;DR: In this paper, an improved weighting assembly for holding a circuit board in contact with test pins is presented. But this assembly is not suitable for circuit board testing with a large number of test pins.
Abstract: Circuit board testing apparatus featuring an improved weighting assembly for holding a circuit board in contact with test pins.
7 citations
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TL;DR: A multitude of technologies and the system user's divergent interests demand problem-oriented test solutions if testing is to remain an economic propostion.
Abstract: If it is true that integrated circuits are the main elements in every modern electronic system, it must also be true that the testing of these components is of prime importance, not only to the manufacturer, but also to the user. Yet, conventional methods, based on the oscilloscope and the trace recorder, are no longer adequate. The question whether an integrated circuit is good or bad is subject to views and interpretations determined by a number of economic and application-oriented rules. Automatic equipment should be capable of meeting every test requirement. A multitude of technologies and the system user's divergent interests demand problem-oriented test solutions if testing is to remain an economic propostion
2 citations