Showing papers in "IEEE Transactions on Manufacturing Technology in 1976"

Test Techniques

Abstract: The test operation is normally limited to the smallest number of tests that effectively measure the ability of the device to meet or exceed a set of reliability and performance criteria. Diagnostic testing, on the other hand, attempts to characterize the device in order to identify fault mechanisms to provide feedback for yield and/or performance improvement. Utilization of the capabilities of computercontrolled automatic test equipment can generate and reduce data to provide meaningful diagnostic feedback while maintaining production throughput.

Why Consider Screening, Burn-In, and 100-Percent Testing for Commercial Devices?

Abstract: In the real world, no component manufacturer can attain loo-percent yield of final product (regardless of how well the device is designed, the scrutiny of incoming materials, or the care taken in assembly)-the user then must decide whether he can tolerate standard product quality levels. This will to some extent depend upon the supplier's integrity, to a large extent upon the interest in reliability shown by the user, and by the complexity of the user's system. The writer feels that for certain categories of components (resistors, capacitors, most low-current diodes, logic or switching transitors, etc.); screening, burn-in, and/or 100-percent testing is not economical. Other specific categories such as: IC's (in reality subsystems), power devices SCR's, Triac's, transistors, etc.), hybrids, memories, microprocessors, etc., lend themselves to the philosophy of paying an insurance premium (screening, burn-in, testing) at the lowest level of assembly. Too often the true costs of board, system, or field repair is swept under the rug for personal or political reasons. This paper is intended to cut a swath through the statistical and accounting morass to enable some sound technical and manufacturing decisions to be reached.

Microprocessor Architecture for Discrete Manufacturing Control, Part I: History and Problem Definition

Abstract: This paper presents a history of computer control in discrete manufacturing and focuses on the computer control problem at the lowest or machine tool level. Succeeding papers will give the specifications for a control computer at this level, derive a system architecture to meet these specifications, and evaluate the computer performance when applied to a control problem. The objective of the total set of papers is to present a computer architecture, based on microprocessor concepts, which will be efficient in a total manufacturing environment involving a hierarchy of control computers. The proposed computer would function at the lowest level of this hierarchy.

Can a User Test LSI Microprocessors Effectively

Abstract: This paper elucidates user oriented test philosophy for LSI microprocessors. Also, a low-cost incoming inspection tester is described. The significant difference between this and available testers is the use of probabilistic scheme by which the instruction, data, and control signal mixes are generated. This approach reduced significantly tester hardware and supporting software without compromise of overall test performance.

Structural Design Analysis Applied to Flexible Circuits

Abstract: A significant consideration to be made with respect to the application of a flexible circuit is the degree to which it can be bent when incorporated into the next level of assembly. The application of stress analysis techniques to arrive at a flexible circuit design that will be structurally sound for a given set of parameters and materials relative to the required application is discussed.

Test Data Reduction

Abstract: The general problem of reducing data available in the integrated circuit environment is addressed. One can consider the circuit to be essentially composed of identification and performance data. Opportunities exist at every level of manufacturing and testing to aid in the final interpretation of the results. Without disturbing the technology or actual circuit design, some general methods for improving testing techniques are discussed. Examples of data reduction and presentation techniques are given where relation between performance and identification can be seen.

Microprocessor Architecture for Discrete Manufacturing Control, Part II: Identification of System Requirements

Abstract: This paper presents an analysis of the computer requirements for the lowest level computer in a hierarchical control structure. The objective of the paper is to identify those points of discrete manufacturing process control which require special consideration and to give the impact of these requirements on the computer architecture. The areas which are investigated are the instruction set, input/output system, interrupt structure, and computer-to-computer communications.

A Practical Approach to Automating Test Stations

Abstract: UTOMATION A of manufacturing processes is a broad and complex task. Many manufacturing operations, particularly those engaged in continuous flow product processing, require nearly total automation. Other manufacturing processes engaged in the assembly of relatively small volumes of complex assemblies find automation very difficult to apply at all. Here is an approach to accomplish the partial automation of electronic testing functions. As an example, we will concentrate on these functions as they apply to the manufacture of electronic printed circuit assemblies. However, the ideas presented can be applied to a wide variety of manufacturing operations. In selecting the methods and extent of automation, the approach chosen strikes a reasonable compromise between the following factors which determine how much can be gained through automation.

Production Research and Technology

Abstract: WO of the most serious and interrelated problems facing the nation during the decade of the seventies and beyond are the control of inflation and the maintenance of and/or increase in the American standard of living. The key factor in increasing the standard of living (growth of wages over prices) and controlling the long term demand component of inflation is continuing increases in productivity. In the past such productivity increases in the manufacturing and service industries have been largely due to technology, and the only source of systematic, long term continued increases of productivity in the future is new technology. If we fail to make such increases, goods wilI become increasingly expensive or foreign in origin because our current skill-based and mass market oriented production methods are approaching the limits of their applicability and cannot be pushed much farther. American production will continue to be improved almost solely by evolution and by importing foreign technology (e.g., as in the steel and printing industries). Additionally, aggressive foreign competitors are actively seeking radical new production technologies through long-term government sponsored R&D programs. U.S.. industries will become increasingly uncompetitive because other nations are attacking basic production problems through long-standing, long-term, formidable R&D programs. This will lead inexorably to a reduced American standard of living and the inability (on the production side) to help in the control of inflation. Recall that in the decade prior to 1971 rising industrial productivity offset the level of inflation (on the order of 2-3 percent per year) and enabled a rising standard of living. Dramatic cost increases in the commodities necessary for manufacturing, (i.e., energy and materials, etc.) demand dramatic productivity increases not obtainable by present production methods. We are not overlooking the necessary efforts to expand energy sources and to improve and increase sources of raw materials. However, these efforts need to be supplemented and their ultimate effects augmented by this additional “production” prong to the attack on inflation. From a policy point of view, one can view the entire Production Research and Technology Program as providing us with technological options in manufacturing. These technological options, once available, will strengthen the free market system in that they can and will be utilized by industry, as necessitated by the economic driving forces of the free market place. It should be noted that total factor productivity is defined as the ratio of the total value of industrial output to the total value of all inputs (resources used) in the production process. These inputs can be broken down into energy, materials,

Analysis of Electronic Component Screening Programs and Their Cost Effectiveness

Abstract: A detailed analysis of screening tests of integrated circuits, transistors, and diodes is presented. Included is a cost-effectiveness study of various types of "screens."

Reliability Improvements in Commercial/Industrial Grade Integrated Circuit Devices

Abstract: Annual operating costs $0.60M 5) Note that a 700-dollar saving (1.5 percent) results from an early investment in screening and testing! Perhaps a step in the right direction might be to supply a Finally, if nothing else is gained from this paper-do not be working sample : bamboozeled by statistics (they can work for or against you); 1) Assume a production run of 100 boards; each of which understand fully what they mean before a decision is made. has 100 components (each of which is purchased to an 0.65 percent AQL). 2) If we further assume a linear distribution, the probability of producing a good board is 52 percent (see the graph of Fig. 2). This means that 48 boards will have to be reworked, components replaced, some boards damaged beyond repair, and full board testing gone through again. Many will argue that this can be accomplished for 10 dollars, but this is felt to be unrealistic in light of records, overhead, etc. 3) Boards produced with sampled or no testing:

The Industrial Automation Institute

Abstract: The 300 professionals of the Israeli Industrial Automation Institute provide technical consultation to modernize industry. In addition they provide courses in industrial automation to 20 000 students each year.

Microprocessor Architecture for Discrete Manufacturing Control, Part III: System Architecture

Abstract: A design for a Level (1) control computer, is presented. The objective is to define a system which meets the requirements of the control environment set forth in an earlier paper. The areas which are discussed are the input system, the output system, the memory system, and the central processing unit.

Screening program effectiveness

Abstract: During the last ten to fifteen years, active and passive device screening has received considerable discussion. The literature contains well over 100 papers dealing with various aspects of part screening and the cost effectiveness of such programs. Although these reports are generally favorable toward the decision to utilize some type of 100-percent testing beyond the manufacturers normal end-of-line testing, most commercial systems and some military systems are routinely assembled using unscreened parts. From this it appears that management's decision variables must differ substantially from those discussed in the various pro-sereening papers. This paper attempts to provide a general means of evaluating a screening program's effectiveness which utilizes terminology appropriate to product management decisions. Any systematic evaluation should provide guidance relative to three areas of concern. 1) Should device screening be imposed for product X? 2) If so, which screens should be used? 3) How can we keep the program dynamic and sensitive to the changing technology? A benefit/cost model utilizes information developed by marketing, manufacturing, and reliability engineering to estimate the total impact of a screening program and provides a quantitative basis for decision making.

Fault Isolation Technique Cuts Testing Costs

Abstract: LL A manufacturers of systems that contain solid-state portions must test the various subassemblies to evaluate quality. How much testing should they do? Which methods provide the required information at lowest testing costs’? Testing adds nothing to a product. It merely evaluates its quality. If it performs just enough tests, it demonstrates that the product functions as specified. If it fails, the manufacturer must repair the product or scrap it. How much testing anyone should perform depends on various factors defined by the manufacturer. Some manufacturers test far beyond a proper minimum while others insist on very little testing. The correct amount lies somewhere in between. Experience shows that only by testing logic subassemblies or circuit boards can manufacturers check out their systems. Advancing technologies and economics made automatic test equipment (ATE) the most cost effective way to perform these tests.