This paper deals with a new method of the alignment of planes and straight lines. Reflecting systems are used, giving double-ray bundles with mirror symmetry.

This paper proposes a novel alignment system based on the measurement of optical path using a light beam scanning mode in a transmissometer. The system controls both the probe beam and the receivin...

A New Method of Alignment in Space

An automatic alignment system for measuring optical path of transmissometer based on light beam scanning

This article describes two methods for measuring the tilt of defective surfaces in a multi-element lens.

Measurement of the tilt of defective surfaces in a multi-element lens

A method is described of measuring the low absorption of a semireflecting film by making use of the effect of the absorption on the interference fringes obtained with the film. The method is to measure the conditions under which an etalon illuminated normally in both directions gives a uniform field of view. From a study of the sources of error in the method it is concluded that the accuracy of measurements made on multilayer dielectric films is three times that which can be expected from straightforward measurements with the same apparatus of R and T. A further threefold improvement is available if a satisfactory physical method of exploring the field of view is used in place of visual inspection.

A New Method of Alignment in Space

Citations

An automatic alignment system for measuring optical path of transmissometer based on light beam scanning

Measurement of the tilt of defective surfaces in a multi-element lens

References

Measurement of Low Absorption in Semireflecting Films

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