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Patent

Contactor for an electronic tester

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TLDR
In this article, the contactor is used for an electronic tester for testing of electronic items such as printed circuit boards, integrated circuits or the like, it has at least one resilient contact pin which has a piston member and a spring.
Abstract
The contactor is used for an electronic tester for testing of electronic items such as printed circuit boards, integrated circuits or the like. It has at least one resilient contact pin which has a piston member and a spring. The piston member and the spring are formed in a single piece from a single piece of metal sheet.

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Probe card assembly and kit, and methods of making same

TL;DR: In this article, a probe card assembly is described, which includes a probe, a space transformer, and an interposer disposed between the space transformer and the probe card to ensure that electrical connections are maintained between the transformer and probe card throughout the transformer's range of adjustment.
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TL;DR: In this article, a probe card assembly is performed on a silicon space transformer, which is mounted in a fixture that provides resilient connection to a wafer or device to be tested.
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Cantilever microprobes for contacting electronic components and methods for making such probes

TL;DR: In this article, compliant probe structures for making temporary or permanent contact with electronic circuits and the like have been described, including cantilever probes with extended base structures, slide-in mounting structures, multi-beam configurations, offset bonding locations to allow closer positioning of adjacent probes, compliant elements with tensional configurations, improved over travel, improved compliance, improved scrubbing capability, and/or the like.
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Microelectronic contact structure, and method of making same.

TL;DR: In this paper, a plurality of spring contact elements are fabricated in a prescribed spatial relationship with one another on the sacrificial substrate, and suitably mounted by their base end portions to corresponding terminals on an electronic component, such as a space transformer or a semiconductor device, for the purpose of probing the electronic component.
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Microelectronic contact structure

TL;DR: In this article, a columnar micro-mechanical structure disposed along a central longitudinal axis is made up of laminated structural layers, each comprised of a structural material, and the resilient portion of the contact structure is comprised of resilient arms defined in the layers.
References
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Compliant lead clip

TL;DR: A compliant lead clip as discussed by the authors is a single strip of metal bent to form a C-shaped and an S-shaped member, the two members having a common portion, which is used to absorb forces which would otherwise be exerted on the solder joints as a result of warpage of the printed circuit board or temperature changes where the chip carrier and printed circuit boards have different thermal coefficients of expansion.
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Spring contact pin

TL;DR: In this paper, a spring contact pin for test devices, for testing electrical items under test, is described, where a cylindrical element in whose cylinder the piston of a spring-loaded contact bolt is supported such that it can slide.