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Patent

Edge detection system and its use for machine learning

Mack Chris
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TLDR
In this paper, the authors proposed a method to remove noise from roughness measurements to determine roughness of a feature in a pattern structure using an inverse linescan model, and evaluated a high-frequency portion of the biased power spectral density (PSD) dataset to determine a noise model for predicting noise over all frequencies, and subtracting the noise predicted by the determined noise model from a biased roughness measure.
Abstract
Systems and methods are disclosed that remove noise from roughness measurements to determine roughness of a feature in a pattern structure. In one embodiment, a method includes generating, using an imaging device, a set of one or more images, each including an instance of a feature within a respective pattern structure. The method also includes detecting edges of the features within the pattern structure of each image using an inverse linescan model, generating a biased power spectral density (PSD) dataset representing feature geometry information corresponding to the edge detection measurements, evaluating a high-frequency portion of the biased PSD dataset to determine a noise model for predicting noise over all frequencies of the biased PSD dataset, and subtracting the noise predicted by the determined noise model from a biased roughness measure to obtain an unbiased roughness measure provided as part of a training data set to a machine learning model.

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Patent

System and method for generating and analyzing roughness measurements

Mack Chris
TL;DR: In this article, a method for determining roughness of a feature in a pattern structure includes generating, using an imaging device, a set of one or more images, each including measured linescan information that includes noise, and then detecting edges of the features within the pattern structure of each image without filtering the images, generating a biased power spectral density (PSD) dataset representing feature geometry information corresponding to the edge detection measurements.
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Patent

Edge detection system

Chris A. Mack
TL;DR: In this paper, an edge detection system is presented that generates a scanning electron microscope (SEM) linescan image of a pattern structure including a feature with edges that require detection.
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