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Patent

Three-dimensional image scanner

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TLDR
In this article, a grating projection type moire topography was used for a three-dimentional image scanner and the pattern information of the object to be measured by using a prescribed lamp.
Abstract
PROBLEM TO BE SOLVED: To quickly and easily input the three-dimensional shape information of an object ot be measured by the large degree of freedom of measurement by utilizing a grating projection type moire topography for a three-dimentional image scanner and to easily input also the pattern information of the object to be measured by using a prescribed lamp. SOLUTION: Three-dimensional shape information is inputted by using a measuring head 12 having a function of a grating projection type moire device. Consequently a reference grating is not required for a grating irradiation type moire device and limitation to the size and arrangement of an object to be measured can be eased. Pattern information is inputted by using a measuring optical system 28 in the head 12. At the time, a measuring reference grating 46 is retreated to a position deviation from the optical path of the optical system by a grating retreating mechanism 58, an illuminating lamp 64 is turned on interlocking with the retreat to irradiate the object to be measured with light and the two-dimensional image of the object to be measured is photographed, so that the required pattern information can be easily and accurately inputted.

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Patent

Method and a device for measuring the three dimension surface shape by projecting moire interference fringe

Lang Liu
TL;DR: In this article, a method and device for measuring 3D surface shape by projected moire interference fringe is presented, which includes a projection device for projecting mark point and main grating line, an observation device for receiving the mark points projected onto the object surface, and two-coordinates rectilinear motion axis.
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Undulation observation device

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