scispace - formally typeset
Search or ask a question

Showing papers on "Contrast transfer function published in 1985"


Patent
Peter A. Levine1
02 May 1985
TL;DR: Stripe patterns of varying spatial frequency, formed in the top-metalization of a back-illuminated solid-state imager, facilitate on-line measurement of contrast transfer function during wafer-probe testing.
Abstract: Stripe patterns of varying spatial frequency, formed in the top-metalization of a back-illuminated solid-state imager, facilitate on-line measurement of contrast transfer function during wafer-probe testing. The imager may be packaged to allow front-illumination during in-the-field testing after its manufacture.

14 citations


Patent
11 Apr 1985
TL;DR: An optical testing method and apparatus employing a noninterferometric technique, making use of axial intensity information, in which the intensity of the light pattern along the optical axis is calibrated to achieve improved measurement of spherical aberration is described in this paper.
Abstract: An optical testing method and apparatus employing a non-interferometric technique, making use of axial intensity information, in which the intensity of the light pattern along the optical axis is calibrated to achieve improved measurement of spherical aberration.

5 citations


Journal ArticleDOI
William Krakow1
TL;DR: A real-time method for optimizing the defocus of a conventional transmission electron microscope in the phase contrast imaging mode has been investigated using image histogram data, which has distinct advantages of speed and minimal computational requirements over obtaining the power spectrum of an image.
Abstract: A real-time method for optimizing the defocus of a conventional transmission electron microscope in the phase contrast imaging mode has been investigated using image histogram data. This method can also be used to minimize the objective lens astigmatism. It will be shown both theoretically and empirically, using a digital television frame store, that a histogram will give the largest peak when an image has a broad and flat contrast transfer function. This method has distinct advantages of speed and minimal computational requirements over obtaining the power spectrum of an image.

4 citations