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Showing papers on "Stuck-at fault published in 1973"


Journal ArticleDOI
TL;DR: Fault folding is the process of applying test equivalent or test implied relations from a primary output towards the connected primary inputs in order to find a reduced set of faults that cover theSet of faults on the intervening network.
Abstract: Fault folding is the process of applying test equivalent or test implied relations from a primary output towards the connected primary inputs in order to find a reduced set of faults that cover the set of faults on the intervening network.

70 citations


Journal ArticleDOI
TL;DR: The model, called Synthetic Tree Model, is a synthesis technique for piecing together, with proper editing, a fault tree from system-independent component information beginnlng with the main failure of interest and proceeding to more basic failures.
Abstract: A model is presented for formulating the Boolean failure logic, cailed the fault tree, for electrical systems from associated schematic diagrams and system-independent component information. The model is developed in detail for electrical systems, while its implication and terminology extend to all fault tree construction. The methodology is verified as formal by fault trees constructed by a computer with typical execution times for a fault tree with 100 gates on the order of 7 sec (on the UNIVAC 1108 computer). The model, called Synthetic Tree Model, is a synthesis technique for piecing together, with proper editing, a fault tree from system-independent component information beginnlng with the main failure of interest and proceeding to more basic failures. The resultant fault trees are in conventional format, use conventional symbols, and are, consequently, immediately compatible with existing solutions techniques. While Synthetic Tree Model develops the fault tree to the level of primary failures, extensions of the model could handle secondary failures, i.e., failure- related feedback between components. ( auth)

58 citations


Patent
06 Apr 1973
TL;DR: In this article, the authors describe the architecture, fault detection and diagnostic capabilities of a sequential control circuit, or sequencer, which can be instructed to test any of a number of circuits by executing one of several fixed sequences.
Abstract: This invention relates to the architecture, fault detection and diagnostic capabilities of a sequential control circuit, or sequencer. The sequential control circuit can be instructed to test any of a number of circuits by executing one of several fixed sequences. The advance from one state to the next in the sequence is dependent on a combination of external signals from the circuit under test, the present sequence state, and the test mode. The new sequence state, in combination with the test mode, cause various actions to take place to further exercise the unit under test.

34 citations


Journal ArticleDOI
TL;DR: A voting technique is used to diagnose fault conditions down to component level in a feedback control system using only the input-output cross-correlation function measured at suitable time delays using a new formula based on Bayes's theorem.
Abstract: A voting technique is used to diagnose fault conditions down to component level in a feedback control system using only the input-output cross-correlation function measured at suitable time delays. These time delays are chosen using a new formula based on Bayes's theorem, which ranks the time delays in order of usefulness in fault diagnosis; it can be readily applied at the design stage, thus assisting the integration of system design and test functions. The fault conditions necessary to set up the scheme may be obtained by direct fault generation in an actual system, or by simulation of the system mathematical model. A learning approach to the design of a fault diagnosis scheme is described which makes full use of any available failure data, together with the ranking formula for time delay selection, in the creation of an optimum scheme.Results obtained on a complex electro-hydraulic servo are presented which show that the scheme works satisfactorily in the presence of measurement noise and parameter drift, two factors which often cause a breakdown in conventional pattern recognition techniques. The computational requirements are extremely modest, and are well within the capacity of present day mini-computers proposed for use in automatic test equipment. In many instances, the scheme is suitable for manual and partially automated test sets, and can be used for fault diagnosis of a wide range of circuits and systems.

28 citations


Journal ArticleDOI
TL;DR: In general, one cannot predict the effects of possible failures on the functional characteristics of a logic network without knowlegde of the structure of that network.
Abstract: In general, one cannot predict the effects of possible failures on the functional characteristics of a logic network without knowlegde of the structure of that network.

20 citations


Journal ArticleDOI
A. K. Susskind1

18 citations


Journal ArticleDOI
TL;DR: A new approach is presented for the design of multiple fault detection tests in which the structure of a combinational circuit is used to reduce the number of input combinations required.
Abstract: A new approach is presented for the design of multiple fault detection tests in which the structure of a combinational circuit is used to reduce the number of input combinations required. The structure is defined by the interconnection of the basic elements, each of arbitrary complexity. The fault model assumes that the functions realized by the basic elements may undergo any deviation whatsoever, but that the circuit structure is fault free. Thus, arbitrary combinations of multiple faults within one or more basic elements are included in the model. Decomposition theory can be used to verify that a set of input combinations is a multiple fault detection test set under this model. A process called expansion will be introduced to simplify this task. A well-defined procedure is given for deriving a suitable test set which for some circuits is minimal or near minimal. It will yield a multiple fault detection test of length less than 2n for any circuit with a nontrivial nondisjoint decomposition, defined by a basic-element partition. Higher order basic-element partitions are introduced as a generalization. An upper bound is given on the length of a multiple fault detection test for any circuit with a given structure, independent of the function realized on the structure. The bound is tighter when function information is also used.

7 citations


Journal ArticleDOI
09 Dec 1973
TL;DR: A fault tolerant multiprocessor architecture suitable for real time control applications requiring an extremely high degree of reliability and related to existing fault tolerant systems, and unique characteristics of the present design are indicated.
Abstract: This paper presents a fault tolerant multiprocessor architecture suitable for real time control applications requiring an extremely high degree of reliability. The architecture satisfies the following requirements: l) Ability to deal with software as well as hardware faults: The proposed architecture is based on the assignment of distinct but redundant software modules to each task. 2) Efficient use of resources: The proposed architecture is a multiprocessor using time redundancy for fault correction. Thus, redundancy (beyond that needed for fault detection) is invoked only when a fault is detected. In normal operation, this extra capacity is available as an additional computing resource. 3) No hard core: In addition to the usual replication of system components, a partitioned system executive and a unique communication facility is defined which insures that the available redundancy will not be lost through a “domino” effect. 4) Interaction of computing units with sensors and effectors: The manner in which system architecture must be responsive to the amount and type of redundancy provided by the sensors and effectors is shown. 5) Use of current technology: The proposed architecture is based on the use of currently available hardware for the major system components. After a detailed description of the architecture and the method of system operation, the system is related to existing fault tolerant systems, and unique characteristics of the present design are indicated.

5 citations


Journal ArticleDOI
TL;DR: A non-Boolean technique, presented herein, initializes u (unknown) values in such a way that diagnostic resolution and accuracy is enhanced and a pure ternary simulator lacks this initialization capability.
Abstract: Generation of test patterns and diagnostics for complex digital modules often involves a ternary (0, 1, u) simulation program. A non-Boolean technique, presented herein, initializes u (unknown) values in such a way that diagnostic resolution and accuracy is enhanced. A pure ternary simulator lacks this initialization capability.