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Showing papers on "Test card published in 2005"


Patent
09 Sep 2005
TL;DR: A disk drive test apparatus (1) has a plurality of bays (4) each for receiving a respective disk drive to be tested as discussed by the authors, each of the test cards is either an environment test card or an interface test card.
Abstract: A disk drive test apparatus (1) has a plurality of bays (4) each for receiving a respective disk drive to be tested. A plurality of card slots (6) are provided each for receiving a test card (7, 8) via which a disk drive can be tested. Each of the test cards is either an environment test card (7) or an interface test card (8). The card slots (6) and the test cards (7, 8) are arranged such that each card slot (6) can selectively receive an environment test card (7) or an interface test card (8). Other arrangements for disk drive test apparatus or disk drive mounting apparatus are disclosed.

54 citations


Patent
James W Frame1
18 Nov 2005
TL;DR: In this article, an electronic chip for use with an automatic testing equipment device testing a device under test is presented, where the output signal is a voltage signal and the purpose of the chip is to measure jitter based upon timing measurements performed by the electronic chip.
Abstract: In a first embodiment of the invention there is provided an electronic chip for use with an automatic testing equipment device testing a device under test. The device under test has a plurality of pins and the electronic chip is placed in a channel of a test card that is associated with one of the pins. An input signal is provided to a pin of the device under test and the resulting output is provided to the pin electronics for the channel of the test card. In most embodiments, the output signal is a voltage signal. One purpose for the electronic chip is to measure jitter based upon timing measurements performed by the electronic chip. Jitter measurements are particularly important for high-speed serial devices. The electronic chip includes an integrating time measurement circuit for receiving the input signal and producing an output signal including a timing measurement of at least a portion of the input signal.

7 citations


Patent
28 Dec 2005
TL;DR: In this article, a PCI test card is described as using signal generator to create signal required by test, outputting signal after it is delayed by delay gate array, using display unit to display numbers of gate delay passed by signal currently, and controlling signal generation and numbers of passed gate delay by control circuit.
Abstract: A PCI test card is featured as using signal generator to create signal required by test, outputting signal after it is delayed by delay gate array, using display unit to display numbers of gate delay passed by signal currently, and controlling signal generation and numbers of passed gate delay by control circuit

2 citations


Patent
19 Jan 2005
TL;DR: In this article, a test card is used to export data for further processing by using test card as a data exporter and data control chip as a buffer to store the data in test card.
Abstract: It is a kind of PCI bus data exporting apparatus and method by using test card to export data for further process. The test card comprises PCI interface, storing module, data control chip and host interface. First, it reads PCI bus data from PCI interface of test card; secondly, it stores the data to the buffer in test card; thirdly, it controls and reads the data in buffer by data control chip of test card and stores it in the buffer of chip; at last, it exports the data in chip through the host interface of test card.

2 citations