Showing papers on "Test harness published in 1981"

Automatic test system utilizing interchangeable test devices

Abstract: An automatic test system controlled by a general purpose digital central processor is disclosed. The central processor accepts test programs in a high level compiler language such as Atlas. The Atlas program is compacted into a simplified language which is utilized to communicate with test devices via a standard IEEE 488 data bus. Each of the test devices includes a programmable interface digital processor which performs any translation that may be necessary in order to permit specific test instruments coupled to the central processor via the interface processor to perform the tests specified by the high level test programs. A switching matrix also communicates with the digital processor to connect the appropriate test device to the unit under test.

Using attributed grammars to test designs and implementations

Abstract: We present a method for generating test cases that can be used throughout the entire life cycle of a program. This method uses attributed translation grammars to generate both inputs and outputs, which can then be used either as is, in order to test the specifications, or in conjunction with automatic test drivers to test an implementation against the specifications.The grammar can generate test cases either randomly or systematically. The attributes are used to guide the generation process, thereby avoiding the generation of many superfluous test cases. The grammar itself not only drives the generation of test cases but also serves as a concise documentation of the test plan.In the paper, we describe the test case generator, show how it works in typical examples, compare it with related techniques, and discuss how it can be used in conjunction with various testing heuristics.

Multi-processor automatic test system

Abstract: A test system utilizing a plurality of programmable test instruments each capable of executing portions of a test program with the test program being written in a compiler language such as ATLAS, for example, is disclosed. Programs specifying the tests to be performed are written in a compiler language such as ATLAS and transferred to a central control processor utilizing standard peripheral equipment. The central control processor communicates with a plurality of test instruments utilizing a series of data busses. In executing the test program, the control processor first segments the program into a series of individual tests to be performed. The test instruments are interrogated to determine which of the test instruments is currently capable of executing a specific sequence of the test program. Once an instrument has been identified which can execute the program segment, the control process transfers that segment to the instrument capable of executing the test. After a test has been executed, the programmable test instrument executing the test transfers the result of the test back to the central control processor for analysis. In addition to performing the basic test, each of the instruments also has access to the switching matrix so that the required interconnects between the system being tested and the test instruments can be made under the control of the test instrument itself. Functionally, each of the test instruments accepts segments of the overall test program in a compiler language and performs all the functions necessary to execute that segment of the program and transfer the test results to the central processor. The function of the central processor is to control the system, allocate portions of the program to each of the test instruments and analyze the final test result. Alternate embodiments provide means permitting any one of the programmable test instruments to assume control of the entire system.

Test Data Verification - Not Just the Final Step for Test Data before Release for Production Testing

Abstract: Increased product complexity has touched all aspects of testing: hardware, software, and procedures. The test data verification process is not immune to this increased complexity. Qualification, validation, and final inspection of the test data prior to its acceptance for use in production testing of printed circuit boards has matured to a science. Large test data volumes, circuit density, technology mixing, sophisticated testers, as well as the extensive product development process, have all contributed to this complexity. Recently, major emphasis and attention have been focused on this critical process. This paper explores the underlying problems associated with traditional test data verification. An effective approach, environment, and total strategy are proposed to deal with the test data verification challenge.