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A.C. Vermeulen

Publications -  1
Citations -  529

A.C. Vermeulen is an academic researcher. The author has contributed to research in topics: Isotropy & Diffraction. The author has an hindex of 1, co-authored 1 publications receiving 484 citations.

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Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

TL;DR: The components of the macroscopic mechanical stress tensor of a stressed thin film, coating, multilayer or the region near the surface of a bulk material can in principle be determined by X-ray diffraction as discussed by the authors.