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A. Purohit

Researcher at Mohanlal Sukhadia University

Publications -  31
Citations -  922

A. Purohit is an academic researcher from Mohanlal Sukhadia University. The author has contributed to research in topics: Thin film & Annealing (metallurgy). The author has an hindex of 14, co-authored 29 publications receiving 677 citations.

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A study on photovoltaic parameters of mono-crystalline silicon solar cell with cell temperature

TL;DR: In this paper, the effect of cell temperature on photovoltaic parameters of mono-crystalline silicon solar cell is undertaken, and the results show that cell temperature has a significant effect on the PV parameters and it controls the quality and performance of the solar cell.
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Impact of temperature on performance of series and parallel connected mono-crystalline silicon solar cells

TL;DR: In this paper, the performance of series and parallel connected mono-crystalline silicon (mono-Si) solar cell employing solar simulator was investigated at constant light intensity 550 W/m2 with cell temperature in the range 25-60 oC.
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Impact of low temperature annealing on structural, optical, electrical and morphological properties of ZnO thin films grown by RF sputtering for photovoltaic applications

TL;DR: In this paper, the effect of low temperature annealing on the physical properties of ZnO thin films for photovoltaic applications is presented. And the experimental results reveal that the films are uniform, homogeneous and free from crystal defects and voids.
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Effect of air annealing on structural, optical, morphological and electrical properties of thermally evaporated CdSe thin films

TL;DR: In this article, a study on effect of air annealing on structural, optical, morphological and electrical properties of CdSe thin films is undertaken, where thin films of thickness 810nm were deposited on glass and ITO coated glass substrates employing thermal evaporation technique.
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Effect of thickness on structural, optical, electrical and morphological properties of nanocrystalline CdSe thin films for optoelectronic applications

TL;DR: In this article, the effect of thickness on the physical properties of thermally evaporated cadmium selenide thin films was presented. And the as-deposited and annealed films were subjected to the XRD, UV-Vis spectrophotometer, source meter, SEM and EDS to find the structural, optical, electrical, morphological and compositional analysis respectively.