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Adam Krzyak

Researcher at Concordia University Wisconsin

Publications -  9
Citations -  510

Adam Krzyak is an academic researcher from Concordia University Wisconsin. The author has contributed to research in topics: Wavelet & Feature extraction. The author has an hindex of 8, co-authored 9 publications receiving 482 citations. Previous affiliations of Adam Krzyak include Concordia University.

Papers
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Image denoising with neighbour dependency and customized wavelet and threshold

TL;DR: Simulated Annealing is used to find the customized wavelet filters and the customized threshold corresponding to the given noisy image at the same time and it is proposed to consider a small neighbourhood around the customizedWavelet coefficient to be thresholded for image denoising.
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An improved handwritten Chinese character recognition system using support vector machine

TL;DR: The enhanced nonlinear normalization method not only solves the aliasing problem in the original Yamada et al.'s nonlinearnormalization method but also avoids the undue stroke distortion in the peripheral region of the normalized image.
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Semi-automatic computer aided lesion detection in dental X-rays using variational level set

TL;DR: A semi-automatic lesion detection framework to detect areas of lesions from periapical dental X-rays using level set method that is able to segment the image into pathological meaningful regions for further analysis and automatically locate the PL and BL with a seriousness level marked for further dental diagnosis.
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Invariant pattern recognition using radon, dual-tree complex wavelet and Fourier transforms

TL;DR: An invariant pattern recognition descriptor is proposed in this paper by using the radon transform, the dual-tree complex wavelet transform and the Fourier transform to achieve high recognition rates for different combinations of rotation angles and noise levels.
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Rotation invariant pattern recognition using ridgelets, wavelet cycle-spinning and Fourier features

TL;DR: This paper has successfully extracted ridgelet features within the circle surrounding the pattern the authors are trying to recognize using ridgelets, wavelet cycle-spinning, and the Fourier transform to achieve rotation invariance.