Albert T. Macrander

TL;DR: A type of linear zone plate for nanometer-scale focusing of hard x rays, a multilayer Laue lens (MLL), produced by sectioning a multILayer and illuminating it in Laue diffraction geometry, indicates that focusing to 5 nm or smaller with high efficiency should be possible.

TL;DR: In this paper, a multilayer Laue lens MLL was used for hard x-ray focusing with a line focus of 16 nm width with an efficiency of 31% at a wavelength = 0.064 nm 19.5 keV.

TL;DR: In this article, the authors presented a formalism of x-ray dynamical diffraction from volume diffractive optics with large numerical aperture and high aspect ratio, in an analogy to the Takagi-Taupin equations for strained single crystals.

TL;DR: In this paper, the authors describe progress in the fabrication of short-focal-length total-external-reflection Kirkpatrick-Baez x-ray mirrors with ultralow figure errors.

TL;DR: Good agreement between the reconstructed wavefront obtained from theX-ray data and off-line metrology data obtained with visible light demonstrates the usefulness of the technique as a metrology and alignment tool for nanofocusing X-ray optics.