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Amaury Badon

Researcher at PSL Research University

Publications -  27
Citations -  460

Amaury Badon is an academic researcher from PSL Research University. The author has contributed to research in topics: Scattering & Optical coherence tomography. The author has an hindex of 10, co-authored 25 publications receiving 311 citations. Previous affiliations of Amaury Badon include Centre national de la recherche scientifique & Boston University.

Papers
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Journal ArticleDOI

Smart optical coherence tomography for ultra-deep imaging through highly scattering media

TL;DR: By combining a matrix discrimination of ballistic waves and iterative time reversal, this work shows an extension of the imaging-depth limit by at least a factor of 2 compared to optical coherence tomography.
Journal ArticleDOI

Multiple scattering limit in optical microscopy

TL;DR: In this paper, the authors derived the single-to-multiple scattering ratio in reflection and deduced the multiple scattering limit for various microscopic imaging techniques such as confocal microscopy, optical coherence tomography and related methods.
Journal ArticleDOI

Distortion matrix concept for deep optical imaging in scattering media.

TL;DR: In this paper, a singular value decomposition of the distortion matrix is proposed to correct high-order aberrations and forward multiple scattering over multiple isoplanatic modes, which can be applied to spatially invariant or thin aberrating layers.
Proceedings ArticleDOI

Smart optical coherence tomography for ultra-deep imaging through highly scattering media

TL;DR: In this article, the authors proposed a matrix approach of optical imaging to push back this fundamental limit by combining a matrix discrimination of ballistic waves and iterative time reversal, both theoretically and experimentally, an extension of the imaging-depth limit by at least a factor of 2 compared to optical coherence tomography.
Journal ArticleDOI

Video-rate large-scale imaging with Multi-Z confocal microscopy

TL;DR: In this paper, a series of reflecting pinholes axially distributed in the detection space, such that each pinhole probes a different depth within the sample, are used to obtain simultaneous multiplane imaging without the need for axial scanning.