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Andreas Nägelein
Researcher at Technische Universität Ilmenau
Publications - 12
Citations - 151
Andreas Nägelein is an academic researcher from Technische Universität Ilmenau. The author has contributed to research in topics: Nanowire & Scanning tunneling microscope. The author has an hindex of 5, co-authored 12 publications receiving 114 citations.
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Journal ArticleDOI
Metalorganic vapor phase epitaxy of III–V-on-silicon: Experiment and theory
Oliver Supplie,Oleksandr Romanyuk,Christian Koppka,Matthias Steidl,Andreas Nägelein,Agnieszka Paszuk,Lars Winterfeld,Anja Dobrich,Peter Kleinschmidt,Erich Runge,Thomas Hannappel +10 more
TL;DR: In this paper, the authors review the recent progress in metalorganic vapor phase epitaxy (MOVPE) growth of III-V-on-silicon heterostructures, preparation of the involved interfaces and fabrication of devices structures.
Journal ArticleDOI
Time-Resolved In Situ Spectroscopy During Formation of the GaP/Si(100) Heterointerface.
Oliver Supplie,Oliver Supplie,Oliver Supplie,Matthias M. May,Matthias M. May,Matthias M. May,Gabi Steinbach,Oleksandr Romanyuk,Frank Grosse,Andreas Nägelein,Peter Kleinschmidt,Sebastian Brückner,Sebastian Brückner,Thomas Hannappel,Thomas Hannappel +14 more
TL;DR: During further pulsing and annealing in phosphorus ambient, dielectric anisotropies known from atomically well-ordered GaP(100) surfaces superimpose the nucleation-related optical in situ spectra.
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In situ controlled heteroepitaxy of single-domain GaP on As-modified Si(100)
Oliver Supplie,Oliver Supplie,Oliver Supplie,Matthias M. May,Matthias M. May,Matthias M. May,Peter Kleinschmidt,Andreas Nägelein,Agnieszka Paszuk,Sebastian Brückner,Sebastian Brückner,Thomas Hannappel,Thomas Hannappel +12 more
TL;DR: In this paper, the formation of atomically well-ordered, As-modified Si(100) surfaces and subsequent growth of GaP/Si (100) quasisubstrates in situ with reflection anisotropy spectroscopy were studied.
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Comparative analysis on resistance profiling along tapered semiconductor nanowires: multi-tip technique versus transmission line method
Andreas Nägelein,Lisa Liborius,Matthias Steidl,Christian Blumberg,Peter Kleinschmidt,A. Poloczek,Thomas Hannappel +6 more
TL;DR: The conclusion that both methods exhibit advantages is found, however the MT-STM was determined as the more precise setup, which enables additional characterization capabilities, such as surface, temperature or light dependent measurements.
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Investigation of charge carrier depletion in freestanding nanowires by a multi-probe scanning tunneling microscope
Andreas Nägelein,Matthias Steidl,Stefan Korte,Bert Voigtländer,Werner Prost,Peter Kleinschmidt,Thomas Hannappel +6 more
TL;DR: In this paper, a four-point prober is combined with a state-of-the-art vapor-liquid-solid preparation, enabling contamination-free nanowires characterization with high spatial resolution.