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Anju Meghwani

Researcher at Indian Institute of Technology Kanpur

Publications -  16
Citations -  442

Anju Meghwani is an academic researcher from Indian Institute of Technology Kanpur. The author has contributed to research in topics: Microgrid & Fault (power engineering). The author has an hindex of 7, co-authored 16 publications receiving 273 citations. Previous affiliations of Anju Meghwani include Indian Institutes of Technology.

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Journal ArticleDOI

A Non-unit Protection Scheme for DC Microgrid Based on Local Measurements

TL;DR: In this paper, a nonunit protection scheme for DC microgrids utilizing only local measurements is proposed based on the natural characteristics of DC current and its first and second derivatives under fault transients.
Proceedings ArticleDOI

A new protection scheme for DC microgrid using line current derivative

TL;DR: In this paper, the proposed scheme is based on the concept of DC current profile under transients, which depends on the fault location and combines with the directional feature to achieve the protection of a DC microgrid.
Journal ArticleDOI

Local Measurements-Based Backup Protection for DC Microgrids Using Sequential Analyzing Technique

TL;DR: A new fault detection method for backup schemes is proposed, which utilizes only the locally measured current signal, and uses both derivative and integral characteristics of current to ascertain the occurrence of a fault.
Proceedings ArticleDOI

A fast scheme for fault detection in DC microgrid based on voltage prediction

TL;DR: A distributed fault detection and localization scheme, based on local measurements, is proposed in this article, which is based on the fact that a fault generally leads to a significant drop in the voltage along with its high rate of change.
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Local measurement-based technique for estimating fault location in multi-source DC microgrids

TL;DR: An online fault location method for multi-source DC microgrid without using communication is proposed and a mathematical model of faulted cable section connected to sources at both the ends is derived to determine the fault distance.