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Arnaud Etcheberry

Researcher at Centre national de la recherche scientifique

Publications -  178
Citations -  2092

Arnaud Etcheberry is an academic researcher from Centre national de la recherche scientifique. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Thin film. The author has an hindex of 22, co-authored 178 publications receiving 1911 citations. Previous affiliations of Arnaud Etcheberry include French Alternative Energies and Atomic Energy Commission & Versailles Saint-Quentin-en-Yvelines University.

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Synthesis of Ultrathin Hexagonal Palladium Nanosheets

TL;DR: In this paper, trathin palladium hexagonal nanosheets were synthesized in emulsions constituted of droplets of toluene containing Pd complexes in water and stabilized by CTAB as surfactant.
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Modification of TiO2 by bimetallic Au–Cu nanoparticles for wastewater treatment

TL;DR: The TRMC measurements show that the TiO2 modification with Au, Cu and Au-Cu nanoparticles plays a role in charge-carrier separations increasing the activity under UV-light and that the bimetallic Au- Cu nanoparticles are more efficient in electron scavenging than the monometallic Au and Cu ones.

Towards ultrathin copper indium gallium diselenide solar cells: proof of concept study by chemical etching and gold back contact engineering

TL;DR: An innovative approach combining chemical etching and a "lift-off" process, which allows back contact processing after CIGSe deposition, permitted to use Au as a highly reflective back contact in ultrathin CIGSE solar cells as discussed by the authors.
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Towards ultrathin copper indium gallium diselenide solar cells: proof of concept study by chemical etching and gold back contact engineering

TL;DR: An innovative approach combining chemical etching and a lift-off process, which allows back contact processing after CIGSe deposition, permitted to use Au as a highly reflective back contact in ultrathin CIGSE solar cells as discussed by the authors.
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X-ray Photoelectron Spectroscopy of Isolated Nanoparticles.

TL;DR: A new experimental approach to XPS is presented based on coupling soft X-ray synchrotron radiation with an in-vacuum beam of free nanoparticles, focused by an aerodynamic lens system, which reveals a nonabrupt interface of the Si/SiO2 interface.