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B. M. Ocko

Researcher at Brookhaven National Laboratory

Publications -  65
Citations -  1559

B. M. Ocko is an academic researcher from Brookhaven National Laboratory. The author has contributed to research in topics: Monolayer & Surface tension. The author has an hindex of 24, co-authored 65 publications receiving 1498 citations.

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Surface Charge—Induced Ordering of the Au(111) Surface

TL;DR: Synchrotron surface x-ray scattering (SXS) studies have been carried out at the Au(lll)/electrolyte interface to determine the influence of surface charge on the microscopic arrangement of gold surface atoms.
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X-ray, micro-Raman, and infrared spectroscopy structural characterization of self-assembled multilayer silane films with variable numbers of stacked layers

TL;DR: In this article, the structure of a series of alcohol-terminated bifunctional long-tail organosilane films with varying numbers of superimposed monolayers (between 1 and 11), prepared on smooth, hydrophilic silicon substrates by the layer-by-layer selfassembly approach, has been investigated with the purpose of elucidating details of the molecular organization and the intra-and interlayer modes of binding in such films.
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The structure and phase behavior of electrodeposited halides on single-crystal metal surfaces

TL;DR: In this article, X-ray scattering results of halide monolayers of bromide and iodide on single-crystal electrodes are presented and both commensurate and incommensurate structures are observed.
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Capillary-wave roughening of surface-induced layering in liquid gallium

TL;DR: The temperature dependence of surface-induced atomic layering in liquid gallium has been investigated with x-ray reflectivity and the measured layering amplitudes are found to be significantly underestimated by existing theory and molecular simulations.
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Wetting, mixing, and phase transitions in Langmuir-Gibbs films.

TL;DR: The novel Langmuir-Gibbs film (LGF) formed is a liquidlike monolayer comprising both alkanes and CTAB tails, and the phase diagram and film structure were determined by x-ray, ellipsometry, and surface tension measurements.