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Baojie Yan

Researcher at Chinese Academy of Sciences

Publications -  241
Citations -  3796

Baojie Yan is an academic researcher from Chinese Academy of Sciences. The author has contributed to research in topics: Nanocrystalline silicon & Silicon. The author has an hindex of 28, co-authored 227 publications receiving 3067 citations. Previous affiliations of Baojie Yan include University of Utah & Nankai University.

Papers
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Proceedings ArticleDOI

Study of metastability in hydrogenated nanocrystalline silicon solar cells

TL;DR: In this article, the light-induced defect generation occurs mainly in the amorphous phase, and a forward current injection does not degrade the c-Si:H cell performance.
Journal ArticleDOI

Excellent surface passivation of p-type TOPCon enabled by ozone-gas oxidation with a single-sided saturation current density of ∼ 4.5 fA/cm2

TL;DR: In this paper , the ozone-gas oxidation was used to prepare the ultra-thin SiOx film, which showed excellent passivation and contact properties for the p-type tunnel oxide passivated contact (p-type TOPCon).
Journal ArticleDOI

Characterization of tunnel oxide passivated contact with n-type poly-Si on p-type c-Si wafer substrate

TL;DR: In this paper, the junction properties of tunnel silicon oxide (SiOx) passivated contact (TOPCon) with n-type poly-Si on p-type c-Si wafer are characterized using currentvoltage (J-V) and capacitance-voltage measurements.
Journal ArticleDOI

Buffer-layer Effect on Mixed-Phase Cells Studied by Micro-Raman and Photoluminescence Spectroscopy

TL;DR: In this article, the effects of an a-Si:H buffer layer at the i/p interface of the mixed-phase silicon solar cells were studied using micro-Raman and photoluminescence (PL) spectroscopy.
Journal ArticleDOI

Electron and Hole Transient Currents in Hydrogenated Amorphous Silicon and Some Alloys Measured by the Photoconductive Time-of-Flight Technique

TL;DR: A series of pure hydrogenated amorphous silicon (a-Si:H) samples as well as carbon and sulfur alloys were investigated by means of the photoconductive time-of-flight technique as mentioned in this paper.