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Binyu Wang

Researcher at Xi'an Jiaotong University

Publications -  9
Citations -  93

Binyu Wang is an academic researcher from Xi'an Jiaotong University. The author has contributed to research in topics: Power module & Insulated-gate bipolar transistor. The author has an hindex of 2, co-authored 7 publications receiving 8 citations.

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Journal ArticleDOI

Interleaved Planar Packaging Method of Multichip SiC Power Module for Thermal and Electrical Performance Improvement

TL;DR: In this article, the authors proposed a double-sided cooling based on planar packaging method, which can get rid of the thermal and electrical challenges in multichip SiC power modules.
Journal ArticleDOI

Thermal Performances and Annual Damages Comparison of MMC Using Reverse Conducting IGBT and Conventional IGBT Module

TL;DR: The results show that when the power factor is greater than 0.4, using RC-IGBT can significantly improve the thermal performance of MMC submodules (SMs) and extend their lifetime.
Journal ArticleDOI

Air-Cooling System Optimization for IGBT Modules in MMC Using Embedded O-Shaped Heat Pipes

TL;DR: In this paper, an optimized and low-cost air-cooling system dedicated to the application of MMCs is proposed, where O-shaped heat pipes are embedded on the heatsink to add another thermal path without extra fans and fins.
Journal ArticleDOI

A Transient 3-D Thermal Modeling Method for IGBT Modules Considering Uneven Power Losses and Cooling Conditions

TL;DR: In this article, a transient 3D thermal modeling method for insulated gate bipolar transistor (IGBT) modules is proposed to obtain accurate temperature distribution considering uneven power losses and cooling conditions.
Proceedings ArticleDOI

A Lifetime Estimation Method of MMC Submodules based on the Combination of FEA and Physical Lifetime Model

TL;DR: This paper studies the fundamental-frequency thermal cycles and proposes a lifetime estimation method of MMC SMs based on the combination of finite element analysis (FEA) and the physical lifetime model which provides a deeper physical description of the failure mechanism and considers the thermal coupling among the chips, which make the lifetime calculation more accurate.