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Brian J. Kenton
Researcher at University of Nevada, Reno
Publications - 7
Citations - 932
Brian J. Kenton is an academic researcher from University of Nevada, Reno. The author has contributed to research in topics: Scanning probe microscopy & Feature-oriented scanning. The author has an hindex of 6, co-authored 7 publications receiving 837 citations.
Papers
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Journal ArticleDOI
Invited review article: high-speed flexure-guided nanopositioning: mechanical design and control issues.
TL;DR: This paper surveys key advances in mechanical design and control of dynamic effects and nonlinearities, in the context of high-speed nanopositioning, as well as future challenges and research topics.
Journal ArticleDOI
Design and Control of a Three-Axis Serial-Kinematic High-Bandwidth Nanopositioner
Brian J. Kenton,Kam K. Leang +1 more
TL;DR: In this article, a three-axis serial-kinematic nanopositioning stage is designed for high-bandwidth applications that include video-rate scanning probe microscopy and high-throughput probe-based nanofabrication.
Journal ArticleDOI
Bridging the gap between conventional and video-speed scanning probe microscopes.
TL;DR: Three techniques that can be used to increase the speed of a conventional scanning probe microscope by greater than one hundred times by the combination of high-speed vertical positioning, sinusoidal scanning, and high- speed image acquisition are described.
Journal ArticleDOI
Compact ultra-fast vertical nanopositioner for improving scanning probe microscope scan speed.
TL;DR: The mechanical design of a high-bandwidth, short-range vertical positioning stage is described for integration with a commercial scanning probe microscope (SPM) for dual-stage actuation to significantly improve scanning performance.
Proceedings ArticleDOI
Design, characterization, and control of a monolithic three-axis high-bandwidth nanopositioning stage
Brian J. Kenton,Kam K. Leang +1 more
TL;DR: In this article, a three-axis serial-kinematic nanopositioning stage for high-bandwidth applications such as video-rate scanning probe microscopy (SPM) is presented.