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Brian J. Simonds

Researcher at National Institute of Standards and Technology

Publications -  64
Citations -  829

Brian J. Simonds is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Laser & Thin film. The author has an hindex of 14, co-authored 59 publications receiving 628 citations. Previous affiliations of Brian J. Simonds include Colorado School of Mines & University of Utah.

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Submicron gap capacitor for measurement of breakdown voltage in air

TL;DR: In this paper, the authors developed a new method for measuring the value of breakdown voltage in air for electrode separations from 400nm to 45μm using thin film Au lines evaporated on sapphire.
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Why the long-term charge offset drift in Si single-electron tunneling transistors is much smaller (better) than in metal-based ones: Two-level fluctuator stability

TL;DR: In this article, the authors present a model for the charge offset drift based on the observation of nonequilibrium heat evolution in glassy materials, and obtain a numerical estimate in go...
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Charge offset stability in tunable-barrier Si single-electron tunneling devices

TL;DR: In this paper, the authors demonstrate that in tunable-barrier Si-based SET transistors there is excellent stability, with a drift that is in general less than 0.01e; these devices exhibit some unwanted sensitivity to external perturbations including temperature excursions.
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Time-Resolved Absorptance and Melt Pool Dynamics during Intense Laser Irradiation of a Metal

TL;DR: The average absorptances determined optically are compared with calorimetrically determined values, and it is found that the calorimeter severely underestimates the absorbed energy due to mass lost during the spot weld.
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Portable, high-accuracy, non-absorbing laser power measurement at kilowatt levels by means of radiation pressure

TL;DR: A non-traditional optical power meter which measures radiation pressure to accurately determine a laser's optical power output, which permits fast measurements, simplifies power scalability, and allows high-accuracy measurements to be made during use of the laser for other applications.