B
Bryan V. Oliver
Researcher at Sandia National Laboratories
Publications - 221
Citations - 2275
Bryan V. Oliver is an academic researcher from Sandia National Laboratories. The author has contributed to research in topics: Diode & Cathode. The author has an hindex of 25, co-authored 219 publications receiving 2164 citations.
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Journal ArticleDOI
Simulation techniques for heavy ion fusion chamber transport
TL;DR: In this paper, a hybrid implicit algorithm was developed to treat dense plasmas accurately, and simulations of neutralized ballistic transport showed improved transport efficiency for a 4-GeV, 4-kA Pb ion beam by including a 1013 cm−3 plasma at initialization.
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Characteristics and scaling of tungsten-wire-array z -pinch implosion dynamics at 20 MA.
M. E. Cuneo,Eduardo Waisman,Sergey Lebedev,J. P. Chittenden,William A. Stygar,Gordon A. Chandler,Roger Alan Vesey,Edmund Yu,Thomas J. Nash,David E. Bliss,G. S. Sarkisov,T. C. Wagoner,G. R. Bennett,Daniel Sinars,John L. Porter,Walter W. Simpson,L. E. Ruggles,David Franklin Wenger,Christopher Joseph Garasi,Bryan V. Oliver,R. A. Aragon,William E. Fowler,M C Hettrick,G. C. Idzorek,Duane D. Johnson,K. L. Keller,S. Lazier,J. S. McGurn,Thomas Alan Mehlhorn,T. C. Moore,D. S. Nielsen,J. Pyle,S. Speas,Kenneth W. Struve,Jose A. Torres +34 more
TL;DR: Cuneo et al. as discussed by the authors showed that very late acceleration is not a universal aspect of wire array implosions and varied the ablation period between 46% +/-2% and 71%+/-3% of the stagnation time.
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Two breakdown mechanisms in ultrathin alumina barrier magnetic tunnel junctions
TL;DR: In this article, two breakdown mechanisms were observed in magnetic tunnel junctions having an ultrathin alumina barrier, and the results suggest that one type of breakdown occurs because of the intrinsic breakdown of a well-formed oxide barrier that can be described by the E model of dielectric breakdown.
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Design, Simulation, and Fault Analysis of a 6.5-MV LTD for Flash X-Ray Radiography
Joshua J. Leckbee,J.E. Maenchen,D.L. Johnson,S. Portillo,D.M. VanDeValde,David V. Rose,Bryan V. Oliver +6 more
TL;DR: In this article, the design of a 6.5-MV linear transformer driver for flash-radiography experiments is presented, and several fault modes are identified, and circuit simulations are used to determine their effect on the output pulse and other components.
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Dielectric breakdown in magnetic tunnel junctions having an ultrathin barrier
TL;DR: In this article, two types of breakdown were observed: abrupt dielectric breakdown at an effective field of 10 MV/cm determined by the thickness of the tunnel barrier, and a gradual breakdown related to defects in the tunnel barriers.