C
C. Barry Carter
Researcher at University of Connecticut
Publications - 424
Citations - 9241
C. Barry Carter is an academic researcher from University of Connecticut. The author has contributed to research in topics: Thin film & Transmission electron microscopy. The author has an hindex of 35, co-authored 418 publications receiving 8765 citations. Previous affiliations of C. Barry Carter include Sandia National Laboratories & University of Minnesota.
Papers
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Book
Transmission Electron Microscopy: A Textbook for Materials Science
TL;DR: In this article, the transmission electron microscope (TEM) is used to detect X-ray spectra and images using a combination of parallel-beam diffraction patterns and CBED patterns.
Journal ArticleDOI
Photosensitization of ZnO nanowires with CdSe quantum dots for photovoltaic devices
Kurtis S. Leschkies,R. Divakar,Joysurya Basu,Emil Enache-Pommer,Janice E. Boercker,C. Barry Carter,Uwe Kortshagen,David J. Norris,Eray S. Aydil +8 more
TL;DR: CdSe semiconductor nanocrystals and single-crystal ZnO nanowires are combined to demonstrate a new type of quantum-dot-sensitized nanowire solar cell that exhibited short-circuit currents ranging from 1 to 2 mA/cm2 and open-circuits voltages of 0.5-0.6 V when illuminated with 100 mW/ cm2 simulated AM1.5 spectrum.
Book
Ceramic Materials: Science and Engineering
C. Barry Carter,M. Grant Norton +1 more
TL;DR: In this article, the authors discuss the role of point defects, charge and diffusion in the process of phase transformation in polycrystalline polycrystals, and propose a phase diagram for each point defect.
Book ChapterDOI
The Transmission Electron Microscope
TL;DR: This chapter starts by introducing you to some of the historical development of the TEM, which can seriously be claimed that no other scientific instrument exists which can offer such a broad range of characterization techniques with such high spatial and analytical resolution, coupled with a completely quantitative understanding of the various techniques.
Journal ArticleDOI
Crystallography of YBa 2 Cu 3 O 6+ x thin film-substrate interfaces
Lisa A. Tietz,C. Barry Carter,D. K. Lathrop,Stephen E. Russek,Robert A. Buhrman,J. R. Michael +5 more
TL;DR: The epitactic nature of the growth of YBa2Cu3O6+x (YBCO) superconducting thin films on ceramic substrates has been studied using high-resolution electron microscopy (HREM) and selected-area diffraction (SAD) of cross-sectional specimens as discussed by the authors.