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J. R. Michael

Researcher at Sandia National Laboratories

Publications -  42
Citations -  7142

J. R. Michael is an academic researcher from Sandia National Laboratories. The author has contributed to research in topics: Grain boundary & Electron backscatter diffraction. The author has an hindex of 21, co-authored 35 publications receiving 6820 citations. Previous affiliations of J. R. Michael include Lehigh University & Bethlehem Steel.

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TEM Sample Preparation and FIB-Induced Damage

TL;DR: In this paper, an overview of the variety of techniques that have been developed to prepare the final transmission electron microscope (TEM) specimen is presented, as well as the problems such as FIB-induced damage and Ga contamination.
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Automated analysis of SEM X-ray spectral images: a powerful new microanalysis tool.

TL;DR: The application of a new automated, unbiased, multivariate statistical analysis technique to very large X-ray spectral image data sets, based in part on principal components analysis, returns physically accurate component spectra and images in a few minutes on a standard personal computer.
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Lithographically Defined Three-Dimensional Graphene Structures

TL;DR: It is demonstrated how prestructured PPF can be chemically converted into hollow, interconnected 3D multilayered graphene structures having pore sizes around 500 nm, which makes this material a promising candidate for microbattery and sensing applications.
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Solidification of nb-bearing superalloys : Part I. Reaction sequences

TL;DR: In this paper, the reaction sequences responsible for microstructural development were found to be similar to those expected in the Ni-Nb-C ternary system and commercial superalloys of comparable composition.