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C. Goetze

Researcher at Massachusetts Institute of Technology

Publications -  18
Citations -  3358

C. Goetze is an academic researcher from Massachusetts Institute of Technology. The author has contributed to research in topics: Creep & Dislocation. The author has an hindex of 16, co-authored 18 publications receiving 3250 citations.

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Stress and temperature in the bending lithosphere as constrained by experimental rock mechanics

TL;DR: In this paper, a limiting yield strength curve, which is primarily a function of temperature, is constructed from data from brittle failure and ductile flow experiments, in order to formulate a more realistic constitutive relation.
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Low-stress high-temperature creep in olivine single crystals

TL;DR: In this paper, a flow law of the form e˙ = ƒ(σ) exp (−Q/RT) is obtained, where σ is an empirical function that is not simply proportional to σn for constant n and Q is equal to 125 ± 5 kcal/mol.
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The temperature variation of hardness of olivine and its implication for polycrystalline yield stress

TL;DR: In this paper, a comparative review of hardness data and compressive creep measurements obtained under large confining pressures confirms the hypothesis of Rice [1971] that single-crystal hardness measurements, corrected for elastic effects, can be correlated to the fully ductile yielding of a polycrystal by dislocation mechanisms, including dislocation climb and glide.
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Plastic flow of oriented single crystals of olivine: 1. Mechanical data

TL;DR: In this article, a total of 41 selectively oriented single crystals of olivine (Fo92) were deformed under uniaxial stresses of 100-1800 bars in the temperature range 1150°-1600°C.

The temperature variation of hardness of olivine and its implication

Brian Evans, +1 more
TL;DR: The variation of hardness with temperature was measured for olivine on a number of crystal faces by the Vickers diamond pyramid technique (up to 800oC) and by a mutual estimation technique (for temperatures up to 1500oC), and a comparative review of hardness data and com-