C
Carmen Varea de Alvarez
Researcher at University of California, Berkeley
Publications - 7
Citations - 116
Carmen Varea de Alvarez is an academic researcher from University of California, Berkeley. The author has contributed to research in topics: Electronic band structure & Pseudopotential. The author has an hindex of 6, co-authored 7 publications receiving 116 citations. Previous affiliations of Carmen Varea de Alvarez include Lawrence Berkeley National Laboratory.
Papers
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Journal ArticleDOI
Calculated and measured reflectivity of ZnGeP/sub 2/
Carmen Varea de Alvarez,Carmen Varea de Alvarez,Marvin L. Cohen,Marvin L. Cohen,S. Kohn,S. Kohn,Y. Petroff,Y. Petroff,Y. R. Shen,Y. R. Shen +9 more
TL;DR: In this article, the reflectivity spectra of the chalcopyrite ternary compound ZnGe${\mathrm{P}}_{2}$ are studied experimentally and theoretically.
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Wavelength-Modulation Spectra and Band Structures of InP and GaP
TL;DR: In this paper, the authors compared with empirical-pseudopotential calculations of the electronic band structure, the imaginary part of the frequency-dependent dielectric function, and the derivative of the reflectivity.
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Electronic density of states and bonding in chalcopyrite-type semiconductors
Carmen Varea de Alvarez,Marvin L. Cohen,Lothar Ley,S. P. Kowalczyk,F. R. McFeely,D. A. Shirley,R. W. Grant +6 more
TL;DR: In this paper, measured x-ray-photo-emission spectra for ZnGeP/sub 2/ and CdSnAs/ sub 2/ were presented along with density-of-states N(E) and charge-density calculations for the two types of spectra.
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Calculated band structures, optical constants and electronic charge densities for InAs and InSb
Carmen Varea de Alvarez,Carmen Varea de Alvarez,John P. Walter,John P. Walter,R.W. Boyd,R.W. Boyd,Marvin L. Cohen,Marvin L. Cohen +7 more
TL;DR: In this paper, the energy band structure, reflectivity, modulated reflectivity and imaginary part of the frequency dependent dielectric function are calculated for InAs and InSb using the empirical pseudopotential method.
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Pressure coefficients for band gaps in silicon
TL;DR: In this article, the authors calculated the pressure coefficients of the main gaps in Si, using the empirical pseudopotential method (EPM), and found a trend toward metallization at high hydrostatic pressures.