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Cédric Gommes

Researcher at University of Liège

Publications -  84
Citations -  2326

Cédric Gommes is an academic researcher from University of Liège. The author has contributed to research in topics: Scattering & Small-angle X-ray scattering. The author has an hindex of 25, co-authored 80 publications receiving 2014 citations. Previous affiliations of Cédric Gommes include Katholieke Universiteit Leuven & Princeton University.

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Sulfonated silica/carbon nanocomposites as novel catalysts for hydrolysis of cellulose to glucose

TL;DR: Sulfonated silica/carbon nanocomposites were successfully developed as reusable, solid acid catalysts for the hydrolytic degradation of cellulose into high yields of glucose as mentioned in this paper.
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Practical methods for measuring the tortuosity of porous materials from binary or gray‐tone tomographic reconstructions

TL;DR: In this article, two methods are proposed to measure the tortuosity of a porous or permeable material from its tomographic reconstruction, based on the shortest distance between two points in the pores, and the geodesic reconstruction of the pore or permeation space.
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Nanoparticle Growth in Supported Nickel Catalysts during Methanation Reaction—Larger is Better†

TL;DR: Understanding the interplay of particle size and support properties related to the stability of nanoparticles offers the prospect of novel strategies to develop more stable nanostructured materials, also for applications beyond catalysis.
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Mesoporosity of zeolite Y: quantitative three-dimensional study by image analysis of electron tomograms.

TL;DR: Quantitative insight into the three-dimensional morphology of complex zeoliteY mesopore networks was achieved by combining electron tomography and image processing, which has great relevance in descriptions of the molecular diffusion through zeolites crystals and, hence, catalytic activity and selectivity.
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Quantitative Structural Analysis of Binary Nanocrystal Superlattices by Electron Tomography

TL;DR: It is illustrated that ambiguous interpretations based on two-dimensional transmission electron microscopy can be prevented, nanocrystal sizes and superlattice parameters accurately determined, individual crystallographic point and plane defects studied, and the order/disorder at the top and bottom surfaces imaged.