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Ch. Dufour

Researcher at University of Caen Lower Normandy

Publications -  102
Citations -  4261

Ch. Dufour is an academic researcher from University of Caen Lower Normandy. The author has contributed to research in topics: Ion & Sputtering. The author has an hindex of 30, co-authored 101 publications receiving 3958 citations. Previous affiliations of Ch. Dufour include Centre national de la recherche scientifique.

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Transient thermal process after a high-energy heavy-ion irradiation of amorphous metals and semiconductors

TL;DR: A transient thermal process is used to describe latent-track formation after high electronic excitation induced by energetic (GeV) heavy ions, and diameters in a-Si and a-Ge are calculated in reasonable agreement with experimental track diameters, taking into account the large differences between the macroscopic thermodynamic parameters of both materials.
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The Se sensitivity of metals under swift-heavy-ion irradiation: a transient thermal process

TL;DR: In this paper, the effect of the electronic stopping power (Se) in metals irradiated by swift heavy ions was investigated in the framework of the thermal-spike model, and the effect on the lattice temperature induced by swift-heavy ion irradiation was calculated.
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Transient thermal processes in heavy ion irradiation of crystalline inorganic insulators

TL;DR: In this paper, a review of matter transformation induced in crystalline inorganic insulators by swift heavy ions is presented, with the emphasis on new results obtained for amorphizable materials such as Gd3Ga5O12, GeS, and LiNbO3 and for nonamorphizable crystals such as SnO2, LiF and CaF2.
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Track creation in SiO2 and BaFe12O19 by swift heavy ions: a thermal spike description

TL;DR: In this article, the authors used the thermal spike model to calculate the track radii variation versus electronic stopping power in two radiolysis resistant oxides: SiO2 quartz and BaFe12O19.
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A high-resistivity phase induced by swift heavy-ion irradiation of Bi: a probe for thermal spike damage?

TL;DR: In this article, the authors derived the rate of the induced damage from in situ electrical resistance measurements, and calculated the evolution with Se of the latent tracks radii on the basis of the thermal spike model, assuming a realistic value for the electron-phonon coupling constant.