C
Chandar Shekar Bellan
Publications - 19
Citations - 346
Chandar Shekar Bellan is an academic researcher. The author has contributed to research in topics: Thin film & Scanning electron microscope. The author has an hindex of 9, co-authored 19 publications receiving 276 citations.
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Transparent nano composite PVA–TiO2 and PMMA–TiO2 thin films: Optical and dielectric properties
TL;DR: In this article, a transparent nano composite PVA and PMMA-TiO2 thin films were prepared by an easy and cost effective dip coating method, which indicated that these films could be used in optoelectronic devices and in thin film transistors.
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Nanostructured materials with plasmonic nanobiosensors for early cancer detection: A past and future prospect
Sathish Sugumaran,Mohd Faizal Jamlos,Mohd Noor Ahmad,Chandar Shekar Bellan,Dominique Schreurs +4 more
TL;DR: It is revealed that the nanostructured material with plasmonic nanobiosensor paves a fascinating platform towards early detection of cancer tumour and is anticipated to be exploited as a magnificent field in the future.
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Characterization of composite PVA–Al2O3 thin films prepared by dip coating method
TL;DR: In this article, composite polyvinyl alcohol-aluminum oxide (PVA-Al2O3) thin films were successfully prepared on precleaned glass plates by dip coating method.
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Transparent with wide band gap InZnO nano thin film: Preparation and characterizations
Sathish Sugumaran,Mohd Noor Ahmad,Mohd Faizal Jamlos,Chandar Shekar Bellan,Sagadevan Pattiyappan,Ranjithkumar Rajamani,Rathish Kumar Sivaraman +6 more
TL;DR: In this article, a novel indium zinc oxide (InZnO) thin film of 100nm thickness was prepared onto pre-cleaned glass plate by thermal evaporation technique from InZnOs nanoparticles.
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New transparent PVA‐InTiO hybrid thin films: influence of InTiO on the structure, morphology, optical, and dielectric properties
Sathish Sugumaran,Chandar Shekar Bellan,Dinesh Muthu,Sengodan Raja,Dinesh Bheeman,Ranjithkumar Rajamani +5 more
TL;DR: In this paper, a polyvinyl alcohol (PVA)-InTiO transparent thin film was prepared by dip-coating method and the presence of elements such as In, Ti, and O are confirmed from energy dispersive X-ray spectroscopy.