Showing papers by "Chris J. Vale published in 2005"
TL;DR: In this paper, Bose-Einstein condensates were manipulated with submicron accuracy above atom-optics chips and a direction sensitive magnetic-field microscope was demonstrated.
Abstract: We present experiments with Bose-Einstein condensates on a combined atom chip. The combined structure consists of a large-scale ``carrier chip'' and smaller ``atom-optics chips,'' containing micron-sized elements. This allows us to work with condensates very close to chip surfaces without suffering from fragmentation or losses due to thermally driven spin flips. Precise three-dimensional positioning and transport with constant trap frequencies are described. Bose-Einstein condensates were manipulated with submicron accuracy above atom-optics chips. As an application of atom chips, a direction sensitive magnetic-field microscope is demonstrated.
70 citations
14 Mar 2005
TL;DR: In this article, the authors describe the production of BECs on a new type of atom chip based on silver foil, which is fabricated with two parallel Z-trap wires, capable of producing two-wire guide and two additional endcap wires for varying the axial confinement.
Abstract: We describe the production of BECs on a new type of atom chip based on silver foil. Our atom chip is fabricated with thick wires capable of carrying currents of several amperes without overheating. The silver surface is highly reflective to light resonant with optical transitions used for Rb. The pattern on the chip consists of two parallel Z-trap wires, capable of producing two-wire guide, and two additional endcap wires for varying the axial confinement. Condensates are produced in magnetic microtraps formed within 1 mm of surface of the chip. We have observed the fragmentation of cold atom clouds when brought close to the chip surface. This results from a perturbed trapping potential caused by nanometer deviations of the current path through the wires on the chip. We present results of fragmentation of cold clouds at distances below 100 µm from the wires and investigate the origin of the deviating current. The fragmentation has different characteristics to those seen with copper conductors. The dynamics of atoms in these microtraps is also investigated. ©2005 COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.