BIST is a viable approach to test today's digital systems. Constraints, such as power, noise, area overhead, and others, limit the possibilities of parallel BIST execution in complex VLSI devices. This paper presents a BIST scheduling process that takes into consideration such constraints, and introduces a new BIST control methodology, that implements the BIST schedule with a highly modular architecture. In fact, due to the uniformity of interface, the BIST control elements are independent of the BIST scheme used in the embedded blocks of a device. This BIST control architecture can provide block level diagnostic information. >

A distributed BIST control scheme for complex VLSI devices

VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

The authors address the problem of estimating the average power dissipated in VLSI combinational and sequential circuits, under random input sequences. Switching activity is strongly affected by gate delays and for this reason a general delay model is used in estimating switching activity. The method takes into account correlation caused at internal gates in the circuit due to reconvergence of input signals. In sequential circuits, the input sequence applied to the combinational portion of the circuit is highly correlated because some of the inputs to the combinational logic are flip-flop outputs representing the state of the circuit. Methods are presented to probabilistically estimate switching activity in sequential circuits. These methods automatically compute the switching rates and correlations between flip-flop outputs. >

/pdf/estimation-of-average-switching-activity-in-combinational-4m6ogafi93.pdf

Estimation of average switching activity in combinational and sequential circuits

The Network Architecture of the Connection Machine CM-5

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

· Most up-to-date coverage of design for testability. 
· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. 
· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
· Lecture slides and exercise solutions for all chapters are now available.
· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

Table of Contents

Chapter 1 - Introduction
Chapter 2 - Design for Testability
Chapter 3 - Logic and Fault Simulation 
Chapter 4 - Test Generation 
Chapter 5 - Logic Built-In Self-Test
Chapter 6 - Test Compression
Chapter 7 - Logic Diagnosis
Chapter 8 - Memory Testing and Built-In Self-Test
Chapter 9 - Memory Diagnosis and Built-In Self-Repair
Chapter 10 - Boundary Scan and Core-Based Testing
Chapter 11 - Analog and Mixed-Signal Testing
Chapter 12 - Test Technology Trends in the Nanometer Age

VLSI Test Principles and Architectures: Design for Testability

In combination with a wheel for a bicycle and the like having an annular rim, a hub rotatable about its axis, and axially offset groups of circumferentially spaced spokes which centrally support the hub on the rim; a wheel decorating ornament comprising an annular, planar sheet of material decorated on opposite sides, axially disposed between the groups of spokes and radially disposed between the rim and the hub.

The Test Access Port and Boundary Scan Architecture

A new approach to testing based on boundary scan is discussed. This technique gives access to individual chip pins by including a little standardized circuitry and a test access port (TAP) on every IC. Boundary scan basics are reviewed, and three principal types of tests that can be performed with the boundary-scan register are described. They are: interconnect tests, using the EXTEST (external test) instruction; chip tests, using the INTEST instruction; and sampling, using the SAMPLE instruction. >

Colin Maunder

Papers

The Test Access Port and Boundary Scan Architecture

Testability on TAP

The Joint Test Action Group

Built-in test for VLSI — pseudorandom techniques: Bardell, P H, McArney, W H and Savir, J Wiley, New York, NY, USA (1987) £45.00 pp 354

Testability on TAP