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D. A. Antonov

Researcher at N. I. Lobachevsky State University of Nizhny Novgorod

Publications -  24
Citations -  172

D. A. Antonov is an academic researcher from N. I. Lobachevsky State University of Nizhny Novgorod. The author has contributed to research in topics: Quantum tunnelling & Conductive atomic force microscopy. The author has an hindex of 6, co-authored 22 publications receiving 91 citations.

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Measurement of the activation energies of oxygen ion diffusion in yttria stabilized zirconia by flicker noise spectroscopy

TL;DR: In this article, the low-frequency noise in a nanometer-sized virtual memristor consisting of a contact of a conductive atomic force microscope (CAFM) probe to an yttria stabilized zirconia (YSZ) thin film was investigated.
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Controllable dissipative tunneling in an external electric field

TL;DR: In this paper, the problem of controllable dissipative tunneling in the system of tunnel-binding quantum dots (quantum molecules) and in the "AFM/STM cantilever tip-quantum dot" system, which was simulated by a double-well oscillator potential interacting with a heat-bath in an external electric field, was studied.
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Observed two-dimensional tunnel bifurcations in an external electric field

TL;DR: The controllability problem for two-dimensional dissipative tunneling in the system of tunnel-coupled quantum dots (a quantum molecule), interacting quantum molecules, and the system "ACM/CTM cantilever tip-quantum dot" simulated by a 2D oscillator potential in a heat bath and an external electric field is investigated in this paper.
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Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles

TL;DR: The negative differential resistance (NDR) has been observed in the I-V curves of the AFM probe contact to the YSZ films with Au NPs in the conductive (“ON”) state.
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Resonant tunnelling through individual Au nanoclusters embedded in ultrathin SiO 2 films studied by Tunnelling AFM

TL;DR: In this paper, the resonant electron tunnelling through the individual Au nano-clusters (NCs) embedded in the ultrathin (4−5 nm thick) SiO2 films on n-Si(001) substrates was reported.