Hybrid analog/digital architectures and receivers with low-resolution analog-to-digital converters (ADCs) are two low power solutions for wireless systems with large antenna arrays, such as millimeter wave and massive multiple-input multiple-output systems. Most prior work represents two extreme cases in which either a small number of radio frequency (RF) chains with full-resolution ADCs, or low-resolution ADC with a number of RF chains equal to the number of antennas is assumed. In this paper, a generalized hybrid architecture with a small number of RF chains and a finite number of ADC bits is proposed. For this architecture, achievable rates with channel inversion and singular value decomposition-based transmission methods are derived. Results show that the achievable rate is comparable to that obtained by full-precision ADC receivers at low and medium SNRs. A trade-off between the achievable rate and power consumption for the different numbers of bits and RF chains is devised. This enables us to draw some conclusions on the number of ADC bits needed to maximize the system energy efficiency. Numerical simulations show that coarse ADC quantization is optimal under various system configurations. This means that hybrid combining with coarse quantization achieves better energy-rate trade-off compared with both hybrid combining with full-resolutions ADCs and 1-bit ADC combining.

Hybrid Architectures With Few-Bit ADC Receivers: Achievable Rates and Energy-Rate Tradeoffs

This paper presents a 64-times interleaved 2.6 GS/s 10b successive-approximation-register (SAR) ADC in 65 nm CMOS. The ADC combines interleaving hierarchy with an open-loop buffer array operated in feedforward-sampling and feedback-SAR mode. The sampling front-end consists of four interleaved T/Hs at 650 MS/s that are optimized for timing accuracy and sampling linearity, while the back-end consists of four ADC arrays, each consisting of 16 10b current-mode non-binary SAR ADCs. The interleaving hierarchy allows for many ADCs to be used per T/H and eliminates distortion stemming from open loop buffers interfacing between the front-end and back-end. Startup on-chip calibration deals with offset and gain mismatches as well as DAC linearity. Measurements show that the prototype ADC achieves an SNDR of 48.5 dB and a THD of less than 58 dB at Nyquist with an input signal of 1.4 . An estimated sampling clock skew spread of 400 fs is achieved by careful design and layout. Up to 4 GHz an SNR of more than 49 dB has been measured, enabled by the less than 110 fs rms clock jitter. The ADC consumes 480 mW from 1.2/1.3/1.6 V supplies and occupies an area of 5.1 mm.

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A 480 mW 2.6 GS/s 10b Time-Interleaved ADC With 48.5 dB SNDR up to Nyquist in 65 nm CMOS

At the turn of this century, there was widespread concern that the performance of analog-to-digital converters (ADCs) might have reached a saturation point and would, in fact, deteriorate as we began to scale into deep submicron CMOS technology. The past 15 years of innovation have clearly refuted such fears. Driven by a combination of application pull, architectural modifications, and relentless optimization, we have seen steady improvements in several key performance metrics.

The Race for the Extra Decibel: A Brief Review of Current ADC Performance Trajectories

A 14-bit SAR ADC is presented that achieves 73.6 dB SNDR at 80 MSPS while using a 1.2-V-only supply. In order to overcome throughput limitations common to conventional SAR ADCs, several techniques are proposed. First, a flash sub-ADC is utilized to resolve the 5 MSBs quickly prior to SAR sequential decisions of the LSBs. Second, the DAC operation is time-interleaved by a factor of 2, increasing speed while allowing a single comparator to be shared between all DACs. Third, fully on-chip DAC charge redistribution allows the DAC settling time to be improved by more than an order of magnitude compared to conventional techniques. Finally, the ADC is fully self-timed through the use of a replica timer circuit in order to take full advantage of the fast DAC settling and comparator decisions. Despite the increased speed, the ADC consumes only 31.1 mW and occupies a core area of 0.55 mm2.

A 14b 80 MS/s SAR ADC With 73.6 dB SNDR in 65 nm CMOS

A 4 GHz third-order continuous-time ΔΣ ADC is presented with a loop filter topology that absorbs the pole caused by the input capacitance of its 4-bit quantizer and also compensates for the excess delay caused by the quantizer's latency. The ADC was implemented in 45 nm-LP CMOS and achieves 70 dB DR and -74 dBFS THD in a 125 MHz BW, while dissipating 260 mW from 1.1/1.8 V supply. The ADC occupies 0.9 mm2 including the modulator, clock circuitry and decimation filter.

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A 4 GHz Continuous-Time $\Delta\Sigma$ ADC With 70 dB DR and $-$ 74 dBFS THD in 125 MHz BW

This paper describes a 16-bit 250 MS/s ADC fabricated on a 0.18 BiCMOS process. The ADC has an integrated input buffer with a new linearization technique that improves its distortion by 5-10 dB and lowers its power consumption by 70% relative to the state of the art. It demonstrates a new background calibration technique to correct the residue amplifier (RA) gain errors and lower its power consumption. This summing node sampling (SNS) calibration technique is based on sampling the summing-node voltage of the residue amplifier and using it with the corresponding residue to estimate the amplifier open loop gain. The ADC achieves an SNDR of 76.5 dB and consumes 850 mW from a 1.8 V supply, while the input buffer consumes 150 mW from a 3 V supply. Up to 125 MS/s, the SFDR is greater than 100 dB for input frequencies up to 100 MHz and 90 dB up to 300 MHz input frequency. At 250 MS/s, the SFDR is greater than 95 dB up to 100MHz and 85 dB up to 300 MHz.

D Lattimore

Papers

A 16-bit 250-MS/s IF Sampling Pipelined ADC With Background Calibration