D
Dae Ho Kim
Researcher at Oak Ridge National Laboratory
Publications - 19
Citations - 1222
Dae Ho Kim is an academic researcher from Oak Ridge National Laboratory. The author has contributed to research in topics: Pulsed laser deposition & Ferroelectricity. The author has an hindex of 11, co-authored 16 publications receiving 1163 citations. Previous affiliations of Dae Ho Kim include Seoul National University.
Papers
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Journal ArticleDOI
Ferromagnetism induced by clustered Co in Co-doped anatase TiO2 thin films.
J.-Y. Kim,Jae-Hoon Park,Byeong-Gyu Park,H. J. Noh,S.-J. Oh,Juhee Yang,Dae Ho Kim,Sang Don Bu,Tae-Hee Noh,H.-J. Lin,H.-H. Hsieh,C. T. Chen +11 more
TL;DR: Ferromagnetism of a newly discovered ferromagnetic semiconductor Co-doped anatase TiO2 thin film is investigated, using the magnetic circular dichroism (MCD) at the Co L(2,3) absorption edges to show that the ferromagnets are induced by a small amount of clustered Co.
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Critical thickness of ultrathin ferroelectric BaTiO3 films
Y. S. Kim,Dae Ho Kim,J. D. Kim,Young Jun Chang,T. W. Noh,J. H. Kong,Kookrin Char,Y. D. Park,S. D. Bu,J.-G. Yoon,J.-S. Chung +10 more
TL;DR: Junquera et al. as discussed by the authors investigated the critical thickness of ferroelectric BaTiO3 (BTO) films, and provided an experimental upper bound of 5nm for the BTO thickness dependent scaling of the remanent polarization.
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Effect of epitaxial strain on ferroelectric polarization in multiferroic BiFeO3 films
TL;DR: In this paper, multiferroic BiFeO3 epitaxial films with thicknesses ranging from 40to960nm were grown by pulsed laser deposition on SrTiO3 (001) substrates with SrRuO3 bottom electrodes.
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Effect of epitaxial strain on ferroelectric polarization in multiferroic BiFeO3 films
TL;DR: In this article, multiferroic BiFeO3 epitaxial films with thickness ranging from 40 nm to 960 nm were grown by pulsed laser deposition on SrTiO3 (001) substrates with SrRuO3 bottom electrodes.
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Applying uniform reversible strain to epitaxial oxide films
TL;DR: In this article, the authors demonstrate using four-circle x-ray diffraction that the piezoelectric substrate of Pb(Mg1/3Nb2/3)0.28O3(001) induces uniform reversible in-plane strain to epitaxially grown oxide films and bilayers.