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Daniel Weimer
Researcher at University of Bremen
Publications - 20
Citations - 1314
Daniel Weimer is an academic researcher from University of Bremen. The author has contributed to research in topics: Automated X-ray inspection & Graphics processing unit. The author has an hindex of 7, co-authored 19 publications receiving 835 citations. Previous affiliations of Daniel Weimer include Technion – Israel Institute of Technology & Biba.
Papers
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Machine learning in manufacturing: advantages, challenges, and applications
TL;DR: In this article, the authors present an overview of available machine learning techniques and structuring this rather complicated area, and a special focus is laid on the potential benefit and examples of successful applications in a manufacturing environment.
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Design of deep convolutional neural network architectures for automated feature extraction in industrial inspection
TL;DR: This contribution investigates a new paradigm from machine learning, namely deep machine learning by examining design configurations of deep Convolutional Neural Networks and the impact of different hyper-parameter settings towards the accuracy of defect detection results.
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Automated surface inspection of cold-formed micro-parts
TL;DR: In this paper, a novel inline surface inspection technique based on texture analysis and statistical image processing methods is introduced, which is realized by means of confocal laser microscopy evaluation on a synthetic dataset and on a real micro cold forming process confirms excellent defect detection results.
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Learning Defect Classifiers for Textured Surfaces Using Neural Networks and Statistical Feature Representations
TL;DR: A machine vision system which uses basic patch statistics from raw image data combined with a two layer neural network to detect surface defects on arbitrary textured and weakly labeled image data is presented.
Forty Sixth CIRP Conference on Manufacturing Systems 2013 Learning defect classifiers for textured surfaces using neural networks and statistical feature representations
TL;DR: In this article, a two-layer neural network was used to detect surface defects on arbitrary textured and weakly labeled image data, which achieved good performance on an artificial dataset with more than 6000 examples.