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David J. Whitehouse
Researcher at University of Warwick
Publications - 125
Citations - 6951
David J. Whitehouse is an academic researcher from University of Warwick. The author has contributed to research in topics: Surface metrology & Stylus. The author has an hindex of 33, co-authored 123 publications receiving 6129 citations. Previous affiliations of David J. Whitehouse include University of Huddersfield & Coventry Health Care.
Papers
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The properties of random surfaces of significance in their contact.
TL;DR: In this paper, the waveform of a random signal is used as a representation of the profile of a surface, which is completely defined by two parameters, a height distribution and an auto-correlation function.
Journal ArticleDOI
The Properties of Random Surfaces of Significance in their Contact
TL;DR: In this article, the waveform of a random signal is used as a representation of the profile of a surface, which is completely defined by two parameters, a height distribution and an auto-correlation function.
Book
Handbook of Surface Metrology
TL;DR: Dowson et al. as mentioned in this paper defined surface metrology as "the nature of SURFACES and the signals obtained from them" and defined a set of definitions for surface metroglobalization.
BookDOI
Handbook of Surface and Nanometrology
TL;DR: In this article, the authors discuss the effect of scale of size on surface geometry and its importance in function, as well as the effects of size and shape on the performance of free-form surfaces.