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BookDOI

Handbook of Surface and Nanometrology

TLDR
In this article, the authors discuss the effect of scale of size on surface geometry and its importance in function, as well as the effects of size and shape on the performance of free-form surfaces.
Abstract
Introduction-Surface and Nanometrology General Surface Metrology Background to Surface Metrology Nanometrology Book Structure Characterization The Nature of Surfaces Surface Geometry Assessment and Parameters Characterization Waviness Errors of Form Characterization of Structured and Free Form Surfaces Characterization of Defects on the Surface Discussion Processing, Operations, and Simulations Digital Methods Discrete (Digital) Properties of Random Surfaces Digital Form of Statistical Analysis Parameters Digital Estimation of References for Surface Metrology Algorithms and Mathematical Techniques Basic Concepts in Linear Programming Fourier Transforms and the Fast Fourier Transform Transformations in Surface Metrology Space-Frequency Functions Surface Generation Atomistic Considerations and Simulations Summary Measurement Techniques Background Measurement Systems Stylus-Micro Measuring Instruments Stylus-Nano/Atomic Scale Optical Techniques Capacitance and Other Techniques Electron Microscopy, Photon Microscopy, Raman Spectrometry Comparison of Techniques-General Summary Some Design Considerations Standardization-Traceability-Uncertainty Introduction Nature of Errors Basic Error Theory Propagation of Errors Statistical Tests for Surface Metrology Uncertainty in Instruments-Calibration in General The Calibration of Stylus and Other Instruments Calibration of Form Instruments Variability of Surface Parameters Gps System-International and National Standards Specification for CAD and on Drawings Summary Surfaces and Manufacture Introduction Manufacturing Processes Cutting Abrasive Processes Unconventional Processes Forming Processes Effect of Scale of Size in Manufacture: Macro to Nano to Atomic Processes Structured Surface Manufacture Manufacture of Free-Form Surfaces Mathematical Processing of Manufacture-Finite Element Analysis (Fe), Md, Nurbs The Subsurface and the Interface Surface Integrity Surface Geometry-A Fingerprint of Manufacture Surface Finish Effects in Manufacture of Microchip Electronic Components Discussion and Conclusions Surface Geometry and Its Importance in Function Introduction Two-Body Interaction-The Static Situation Macro to Nanoscale, Contact, Adhesion Corrosion Two-Body Interactions-Dynamic Behavior Macro to Nanoscale, Friction, Wear, Lubrication One-Body Interactions- Optical Scatter, Diffraction System Function Multi-Surfaces Assembly Discussion Conclusions Surface Geometry, Scale of Size Effects, Nanometrology Introduction Effect of Scale of Size on Surface Geometry Scale of Size, Surface Geometry, and Function Scale of Size and Surfaces in Manufacture Nano Instrumentation Operation and Design Considerations Standards, Traceability, and Uncertainty at the Nanoscale Measurement of Typical Nanofeatures Measuring Length to Nanoscale with Interferometers and Other Devices Nano Geometry in Macro Situations Discussion and Conclusions General Comments Introduction Characterization Processing, Operations, and Simulations Measurement Techniques Traceability Standardization Uncertainty Surfaces and Manufacture Surface Geometry and Performance Nanometrology Overview Glossary Index References appear at the end of each chapter.

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Citations
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Journal ArticleDOI

Quantitative characterization of surface topography using spectral analysis

TL;DR: In this paper, the power spectral density (PSD) of the surface topography of real-world surfaces has been used for tuning functional properties of surfaces, such as adhesion, friction, and contact conductance.
Journal ArticleDOI

Technological shifts in surface metrology

TL;DR: An overview of the progress made in surface metrology over the past ten years can be found in this paper, where the authors discuss technological shifts in association, filtration, numeric parametric techniques, fractals associated with function and standardisation.
Journal ArticleDOI

On-machine and in-process surface metrology for precision manufacturing

TL;DR: Error separation algorithms for removing machine tool errors, which is specially required in on-machine and in-process surface metrology, are overviewed, followed by a discussion on calibration and traceability.
Journal ArticleDOI

Quantitative characterization of surface topography using spectral analysis

TL;DR: In this article, the power spectral density (PSD) of the surface topography has been used to predict surface properties, such as adhesion, friction, and contact conductance.
Journal ArticleDOI

Accuracy prediction in fused deposition modeling

TL;DR: In this paper, a geometrical model of the filament, dependent upon the deposition angle and layer thickness, has been developed in order to predict the obtainable part dimensions, which can be used to choose the suitable manufacturing strategy to comply with industrial constrains and scopes.
References
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Journal ArticleDOI

Orthonormal bases of compactly supported wavelets

TL;DR: This work construct orthonormal bases of compactly supported wavelets, with arbitrarily high regularity, by reviewing the concept of multiresolution analysis as well as several algorithms in vision decomposition and reconstruction.
Journal ArticleDOI

Mathematical analysis of random noise

TL;DR: In this paper, the authors used the representations of the noise currents given in Section 2.8 to derive some statistical properties of I(t) and its zeros and maxima.
Journal ArticleDOI

On the Quantum Correction for Thermodynamic Equilibrium

TL;DR: In this paper, it was shown that instead of Wigner's approximation, instead of the classical potential U in the exponent by U-kTf, where f is the same as Wigneer's function, the probability of any configurational position is then proportional to exp −U/kT, with U the potential energy.

The properties of random surfaces of significance in their contact.

TL;DR: In this paper, the waveform of a random signal is used as a representation of the profile of a surface, which is completely defined by two parameters, a height distribution and an auto-correlation function.