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David L. Griscom

Researcher at United States Naval Research Laboratory

Publications -  134
Citations -  9457

David L. Griscom is an academic researcher from United States Naval Research Laboratory. The author has contributed to research in topics: Electron paramagnetic resonance & Optical fiber. The author has an hindex of 51, co-authored 134 publications receiving 9096 citations. Previous affiliations of David L. Griscom include United States Department of the Navy & University of Arizona.

Papers
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Optical Properties and Structure of Defects in Silica Glass

TL;DR: In this paper, the authors review what is known about the structures and optical properties of point defects in silica glass and other amorphous forms of SiO2 using electron spin resonance (ESR) spectrometry.
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Electron spin resonance in glasses

TL;DR: A review of electron spin resonance (ESR) studies in glasses can be found in this paper, where transition-group ions, radiation-induced defect centers, ferromagnetic precipitates, and photo-induced centers are discussed.
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Diffusion of radiolytic molecular hydrogen as a mechanism for the post‐irradiation buildup of interface states in SiO2‐on‐Si structures

TL;DR: In this paper, a review of recent literature dealing with radiation-induced point defects distributed volumetrically in thermally grown SiO2•on-Si or superficially at the silicon interface is made, with particular emphasis on the results of electron spin resonance experimentation.
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Defect structure of glasses: Some outstanding questions in regard to vitreous silica

TL;DR: In this paper, the defect structure of glasses is discussed primarily in the context of vitreous silicon dioxide (v-SiO2) and a unified picture of radiation-damage processes is formulated for high-purity silicas of both low and high-OH contents.