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Don Williams

Researcher at Eastman Kodak Company

Publications -  30
Citations -  295

Don Williams is an academic researcher from Eastman Kodak Company. The author has contributed to research in topics: Digital image & Digital imaging. The author has an hindex of 10, co-authored 29 publications receiving 278 citations.

Papers
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Refined Slanted-Edge Measurement from Practical Camera and Scanner Testing.

TL;DR: Refinement in data screening for signal encoding problems, edge feature location and slope estimation, and noise resilience will be addressed in slanted-edge gradient analysis.

Diagnostics for Digital Capture using MTF

TL;DR: Using the slanted-edge MTF technique described in ISO 12233, a variety of MTF examples associated with characteristics from the above list are shown for several actual digital capture devices.
Proceedings ArticleDOI

Low-frequency MTF estimation for digital imaging devices using slanted edge analysis

TL;DR: Using a form of edge-gradient analysis based on slanted edges, a method for measurement of low-frequency, visually significant characteristics of veiling flare, micro flare, and integrating cavity effect can be measured by carefully adapting this well-established technique.

Using Slanted Edge Analysis for Color Registration Measurement

TL;DR: A digital image processing method to measure translation error between color records, that can be computed from the acquired image, has proven reliable and can be applied to images acquired from both digital cameras and scanners.
Proceedings ArticleDOI

Evolution of slanted edge gradient SFR measurement

TL;DR: Several modifications of the standard method to suit specific system characteristics, unique measurement needs, or computational shortcomings in the original method are described, and how they have improved the reliability of the resulting system evaluations are described.