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Dongmin Chen

Researcher at Rowland Institute for Science

Publications -  41
Citations -  1556

Dongmin Chen is an academic researcher from Rowland Institute for Science. The author has contributed to research in topics: Scanning tunneling microscope & Scanning tunneling spectroscopy. The author has an hindex of 22, co-authored 40 publications receiving 1512 citations. Previous affiliations of Dongmin Chen include Brookhaven National Laboratory & Harvard University.

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Electron Fringes on a Quantum Wedge

TL;DR: In this article, a flat-top lead island on a stepped Si(111) surface has been fabricated using molecular beam epitaxy, which reveals the phenomenon of electron interference fringes: a discrete periodic spatial variation of the tunnel current originating from the quantization of electron states in the wedge.
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Demonstration of the tunnel-diode effect on an atomic scale

TL;DR: In this paper, negative differential conductivity on particular binding sites of a Si (111) surface doped with boron was observed at 1.4 V tip bias at a specific type of site.
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Topology of two-dimensional C60 domains.

TL;DR: Use of high-resolution scanning tunnelling microscopy shows that a 60-carbon-atom array on a self-assembled monolayer of an alkylthiol forms an ideal two-dimensional system which has another novel topological order originating from the orientational degrees of freedom.