D
Douglas W. Kemerer
Researcher at IBM
Publications - 18
Citations - 321
Douglas W. Kemerer is an academic researcher from IBM. The author has contributed to research in topics: Electromigration & Integrated circuit. The author has an hindex of 10, co-authored 18 publications receiving 321 citations.
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Patent
Integrated circuit chip having gate array book personalisation using local interconnect
TL;DR: In this article, a gate array book layout for an integrated circuit chip is disclosed in which a local interconnect layer provides N-well and P-well contact straps extending substantially along the entire width of said gate array books across the top and bottom edges thereof.
Patent
Method of combining gate array and standard cell circuits on a common semiconductor chip
Elliot L Gould,Douglas W. Kemerer,Lance A Mcallister,Ronald A. Piro,Guy R Richardson,Deborah A Wellburn +5 more
TL;DR: In this paper, a method and semiconductor structure for intermixing circuits of two or more different cell classes on a common chip or substrate with minimum gound rule separation between adjacent cells of different classes.
Patent
Support structures for wirebond regions of contact pads over low modulus materials
Lloyd G. Burrell,Douglas W. Kemerer,Henry A. Nye,Hans-Joachim Barth,Emmanuel F. Crabbe,David W Anderson,Joseph Ying-Yuen Chan +6 more
TL;DR: In this paper, a semiconductor device (200) having support structures (218, 226, 236) beneath wirebond regions (214) of contact pads (204) and a method of forming same.
Patent
Wiring design tool improvement for avoiding electromigration by determining optimal wire widths
David J. Hathaway,Douglas W. Kemerer,William J. Livingstone,Daniel Joseph Mainiero,Joseph Leonard Metz,Jeannie H. Panner +5 more
TL;DR: In this paper, the authors propose a method for wiring IC chips such that electromigration criteria are met while minimizing the effect on overall chip wireability. And they also propose a technique to optimize the width of automatically routed wire segments so that these widths are adequate to support the electromigration current on that net as a function of the capacitive loading of the net itself.
Patent
Programmable on-chip sense line
TL;DR: In this paper, a programmable on-chip sensing network that can be selectively connected to the power distribution network at multiple locations at an optimal sensing point is generated and used to adjust the power supply voltage.