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Duane Connerney
Researcher at Fairchild Semiconductor International, Inc.
Publications - 2
Citations - 3
Duane Connerney is an academic researcher from Fairchild Semiconductor International, Inc.. The author has contributed to research in topics: Electrostatic discharge & Event (computing). The author has an hindex of 1, co-authored 2 publications receiving 3 citations.
Papers
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Proceedings Article
A predictive full chip dynamic ESD simulation and analysis tool for analog and mixed-signal ICs
TL;DR: DynEsdChecker as discussed by the authors can simulate the ESD event on the layout containing RC extractions, can generate full chip ESD verification results, and can provide user with guidelines on how to revise the design to meet the design target.
Patent
Undervoltage protection system
TL;DR: In this article, the undervoltage protection circuitry is configured to shunt under-voltage current resulting from an under voltage transient in the supply voltage away from the electronic circuitry.