E
E. Anguiano
Researcher at Autonomous University of Madrid
Publications - 42
Citations - 631
E. Anguiano is an academic researcher from Autonomous University of Madrid. The author has contributed to research in topics: Scanning tunneling microscope & Fractal. The author has an hindex of 12, co-authored 42 publications receiving 596 citations. Previous affiliations of E. Anguiano include Spanish National Research Council & IBM.
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Journal ArticleDOI
BiosecurID: a multimodal biometric database
Julian Fierrez,Javier Galbally,Javier Ortega-Garcia,M.R. Freire,Fernando Alonso-Fernandez,Daniel Ramos,Doroteo Torre Toledano,Joaquin Gonzalez-Rodriguez,Juan A. Sigüenza,J. Garrido-Salas,E. Anguiano,Guillermo Gonzalez-de-Rivera,Ricardo Ribalda,Marcos Faundez-Zanuy,Juan Antonio Ortega,Valentín Cardeñoso-Payo,A. Viloria,Carlos E. Vivaracho,Q. I. Moro,Juan J. Igarza,Jon Sanchez,Inma Hernaez,Carlos Orrite-Urunuela,Francisco Martinez-Contreras,Juan Jose Gracia-Roche +24 more
TL;DR: A new multimodal biometric database, acquired in the framework of the BiosecurID project, is presented together with the description of the acquisition setup and protocol and features such as: realistic acquisition scenario, balanced gender and population distributions, availability of information about particular demographic groups, and compatibility with other existing databases.
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Electrochemical preparation of tungsten tips for a scanning tunneling microscope
TL;DR: In this article, the authors present experimental results obtained during the electrochemical preparation of tungsten tips for a scanning tunneling microscope, and they found that KOH is better than NaOH as an electrolyte to prepare tips for scanning tunnelling microscopy and that tip quality increases as the wire diameter and immersed portion increases.
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Fractal characterization by frequency analysis. I: Surfaces
TL;DR: In this article, a study of the quality and accuracy of the methods based on frequency analysis for the fractal characterization of surfaces as measured by scanning tunnelling microscopy (or profilometry) is made.
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Fractal characterization by frequency analysis. II. A new method
TL;DR: In this article, a new frequency analysis method, fractal analysis by circular average (FACA), and an image replication procedure are proposed that together produce accurate measurements of the fractal dimension of surfaces and profiles, eliminating Fourier transform artefacts which arise from the lack of periodic continuity in real surfaces and profile.
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Analysis of scanning tunneling microscopy feedback system
TL;DR: In this paper, a theoretical analysis of the feedback system in the scanning tunneling microscope (STM) is presented, which includes all the elements involved in the STM loop and the mathematical models for each element of the loop has been used and the problem has been solved using control theory.