E
E. S. Snow
Researcher at United States Department of the Navy
Publications - 28
Citations - 3596
E. S. Snow is an academic researcher from United States Department of the Navy. The author has contributed to research in topics: Carbon nanotube & Nanotube. The author has an hindex of 20, co-authored 28 publications receiving 3536 citations.
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Random networks of carbon nanotubes as an electronic material
TL;DR: In this article, the transport properties of random networks of single-wall carbon nanotubes fabricated into thin-film transistors were investigated and shown to behave like a p-type semiconductor with a field effect mobility of ∼10 cm2/V and a transistor on-to-off ratio of ∼105.
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Nerve agent detection using networks of single-walled carbon nanotubes
TL;DR: In this article, the use of carbon nanotubes as a sensor for chemical nerve agents was reported, and the results indicate that the electronic detection of sub-ppb concentrations of nerve agents and potentially other chemical warfare agents is possible with simple-to-fabricate nanotube devices.
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Fabrication of si nanostructures with an atomic force microscope
E. S. Snow,Paul M. Campbell +1 more
TL;DR: In this article, an air-operated atomic force microscope (AFM) was used to oxidize regions of size 10-30 nm of a H-passivated Si (100) surface at write speeds up to 1 mm/s.
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High-mobility Carbon-nanotube Thin-film Transistors on a Polymeric Substrate
TL;DR: In this article, the authors report the development of high-mobility carbon-nanotube thin-film transistors fabricated on a polymeric substrate, where the active semiconducting channel is composed of a random two-dimensional network of single-walled carbon nanotubes (SWNTs).
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Fabrication of nanometer‐scale side‐gated silicon field effect transistors with an atomic force microscope
TL;DR: In this article, the fabrication of nanometer-scale side-gated silicon field effect transistors using an atomic force microscope is reported. The probe tip was used to define nanometerscale source, gate, and drain patterns by the local anodic oxidation of a passivated silicon (100) surface.