Methods and systems for determining a critical dimension and overlay of a specimen

The system enables one to securely recycle an electronic device in a publicly accessible location. In particular, the embodiment described may be used by a mobile phone owner to submit his/her mobile phone for recycling via an electronic kiosk and receive compensation in some form. The compensation might be dispersed via cash, voucher, credit or debit card, or other magnetic or electronic transaction methods.

Secondary market and vending system for devices

The lighting behavior of a vision system is inconsistent between vision systems, within a vision system over time or between parts being viewed. This inconsistency makes it difficult to correctly run part programs even within a single run of parts on a single machine. The multi area image quality tool systems, methods and graphical user interfaces adjust the light intensity of a vision system to obtain a desired image quality or characteristic of a captured image. The multi area image quality tool is used to define a plurality of regions of interest within a captured image to be used to determine the image quality or characteristic of the captured image resulting from a current illumination level. The multi area image quality tool allows a user to easily and quickly define multiple regions of interest that can be used to determine the image quality of a captured image. The multi area image quality tool allows the user to specify the location, orientation and size of two or more regions of interest around a critical feature of the captured image, and to specify the light sources to be used to illuminate the part, the image quality to be measured, and a range of acceptable values for that image quality. Portions of the image are extracted based on the defined regions of interest. The image quality of the captured image is determined based on an analysis of the regions of interest and the image quality defined in the multi area image quality tool.

Systems and methods for adjusting lighting of a part based on a plurality of selected regions of an image of the part

Methods and systems for determining a critical dimension, a presence of defects, and a thin film characteristic of a specimen

A recycling kiosk (100) for recycling and financial remuneration for submission of a mobile telephone (150) is disclosed herein. The recycling kiosk (100) preferably includes an inspection area (106) with a plurality of white walls (115) in order to perform a visual analysis of the mobile telephone (150) for determination of a value of the mobile telephone (150). The visual analysis inspects the LCD screen (153) of the mobile phone (150) to determine if the LCD screen (153) is damaged. The recycling kiosk (100) also includes a processor (160), a display (119) and a user interface (118).

Apparatus and method for recycling mobile phones

An automated inspection system particularly adapted for detection and discrimination of surface irregularities of specularly reflecting and other materials, such as are employed in laminate chip carriers and printed circuit boards, includes an area scan image sensor allowing illumination sources to surround an area of a surface being inspected. The illumination source preferably provides either or both bright field and dark field illumination of the surface; developing generally complementary images of surface irregularities. A self-registering rules-driven process for developing inspection masks reduces alignment operations and improves performance. Image enhancement and morphological operations to detect surface irregularities are performed by digital signal processing, preferably using a dedicated vision processor. Masks screen potential defects to critical mounting and bonding surfaces accurately without requiring alignment of data or reference images to acquired images. Since potential defects are copied from acquired images and stored, verification of defects may be performed without further access to the inspected part and without removal of the part to another specialized apparatus, simplifying processing and increasing throughput and operator efficiency.

Automated inspection system for metallic surfaces

A dual mode illumination system for optical inspection of products for surface defects and defects in holes in the product includes a first light source for providing illumination along an axis of one or more holes in the product to be inspected, the first light source being positioned on a first side of the product, a second light source providing illumination of the surface of the second side of the product to be inspected, a beam splitter for redirecting light from the second light source to a light sensor while passing light from the first light source to the light sensor. The second light source may be located adjacent to a second side of the product to be tested with the axis of illumination parallel to a major plane of the product. The light sensor may be a video camera connected to a data processing and display system.

Earle W. Gillis

Papers

Automated inspection system for metallic surfaces

Dual mode illumination system for optical inspection