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Peter J. Yablonsky

Researcher at IBM

Publications -  5
Citations -  95

Peter J. Yablonsky is an academic researcher from IBM. The author has contributed to research in topics: Köhler illumination & Analog signal. The author has an hindex of 4, co-authored 5 publications receiving 95 citations.

Papers
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Patent

Computer controlled, multiple angle illumination system

TL;DR: In this paper, the authors present an illumination system as a part of an optical inspection system, the total inspection system itself, and the method of illuminating and inspecting a workpiece.
Patent

Dual mode illumination system for optical inspection

TL;DR: In this article, a dual mode illumination system for optical inspection of products for surface defects and defects in holes in the product includes a first light source for providing illumination along an axis of one or more holes, a second light source providing illumination of the surface of the second side of the product to be inspected, and a beam splitter for redirecting light from the second source to a light sensor while passing light from a light source to the light sensor.
Patent

Configurable application integrating service request and fulfillment process

TL;DR: In this paper, a method and system for generating a plurality of concurrent solutions for a corresponding plurality of service requests each having one or more service types is presented, which comprises the steps of defining a set of said service types and a sequence of activities for each said service type; and for each service request, configuring a workflow of said activities from said services in each said request.
Patent

Analog video processing apparatus and method for eliminating background levels in the analog signal

TL;DR: In this article, an optical inspection system is provided in which the background video component of an analog video source which limits imaging integrity is removed enhancing the system's ability to process a wider range of image sources with increase digitizing sensitivity.
Patent

Optical inspection system utilizing dynamic analog-to-digital thresholding

TL;DR: In this paper, an optical imaging surface inspection system and method is described, which includes an illumination source for illuminating an image pattern on a surface to be inspected, a video camera for detecting a portion of the light reflected from the surface and outputting an analog video signal, a dynamic thresholding circuit for converting the analog video signals into a digital representation of the image pattern, and means to compare a known accurate digital representation provided by the dynamic thresholded circuit.