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Elisabeth A. Duijnstee

Researcher at University of Oxford

Publications -  9
Citations -  387

Elisabeth A. Duijnstee is an academic researcher from University of Oxford. The author has contributed to research in topics: Perovskite (structure) & Chemistry. The author has an hindex of 4, co-authored 5 publications receiving 102 citations. Previous affiliations of Elisabeth A. Duijnstee include University of Groningen.

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Toward understanding space-charge limited current measurements on metal halide perovskites

TL;DR: The metal halide perovskite semiconductors have sprung to the forefront of research into optoelectronic devices and materials, largely because of their remarkable photovoltaic efficiency records as discussed by the authors.
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Revealing Charge Carrier Mobility and Defect Densities in Metal Halide Perovskites via Space-Charge-Limited Current Measurements

TL;DR: In this article, the drift-diffusion (DD) simulations were used to obtain a trap density of 1.3 × 1013 cm-3 and an ion density of 13 cm2 V-1 s-1 for a MAPbBr3 single crystal.
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Rough Electrode Creates Excess Capacitance in Thin-Film Capacitors

TL;DR: This work experimentally and theoretically shows that the electrical capacitance of thin-film capacitors with realistic interface roughness is significantly larger than the value predicted by the parallel-plate capacitor equation.
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Understanding Dark Current-Voltage Characteristics in Metal-Halide Perovskite Single Crystals

TL;DR: In this paper, the authors performed temperature-dependent pulsed-voltage space-charge-limited current measurements to provide a detailed look into the electronic properties of metal-halide perovskite single crystals.
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Long-range charge carrier mobility in metal halide perovskite thin-films and single crystals via transient photo-conductivity

TL;DR: In this paper , the authors estimate long-range charge carrier mobilities over a wide range of photo-excitation densities via transient photoconductivity measurements and demonstrate how their data-processing technique can also reveal more precise mobility estimates from non-contact time-resolved microwave conductivity measurements.